Analytical Atomic Resolution Electron Microscope JEM-ARM200F (JEOL)

FACILITIES / CARACTERIZARI-STRUCTURALE

Analytical Atomic Resolution Electron Microscope JEM-ARM200F (JEOL)
Configuration
  • Field Emission Gun (FEG)
  • Cs-corrector for STEM mode
  • STEM Unit
  • EDS Unit: JEOL JED-2300T
  • EELS and Image Filter: Gatan Quantum SE
CCD Cameras:
  • Gatan Orius 200D – wide angle port
  • Gatan Ultrascan 1000XP -bottom mounted
  • Gatan Ultrascan 1000FT – GIF camera
Working modes
CTEM, HRTEM, STEM BF, STEM ADF, STEM ,HAADF, SAED, nano-ED, CBED, EDS, EELS, EFTEM, EELS-SI
Technical specifications:
  • Accelerating voltages: 80, 120, 160, 200 kV
  • TEM magnification: 50 – 2 000 000 ×
  • TEM resolution: 0.19 nm
  • STEM magnification: 200 – 150 000 000 ×
  • STEM-HAADF resolution: 0.08 nm
  • EDS – energy resolution EDS: 131,4 eV (Mn-Ka)
    • available in TEM mode;
    • available in STEM mode: spot, line profile or 2D mapping;
  • EELS – energy resolution 0.7 eV

Analytical Atomic Resolution Electron Microscope JEM-ARM200F (JEOL)



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