Scanning electron microscope Evo 50 XVP with EDAX attachment (Carl Zeiss NTS )

FACILITIES / STRUCTURAL-CHARACTERIZATION

Scanning electron microscope Evo 50 XVP with EDAX attachment (Carl Zeiss NTS )
Technical details:
  • LaB6 cathode enabling a 2 nm resolution
  • dual mode operation in high and low vacuum
  • EDX accessory, down to Bohr, 133 eV resolution
  • Cathodoluminescence accessory 200 – 1300 nm


Back to top

Copyright © 2024 National Institute of Materials Physics. All Rights Reserved