Atomic Force Microscope AFM/PFM MFP-3D-SA (Asylum Research)

The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale. With the MFP-3D Stand Alone (MFP-3D-SA) AFM, scientists can now choose a sensitive and precise AFM with the lowest noise performance that also includes a complete scientific software environment. The MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements. The MFP-3D has the flexibility to acquire your data, analyze it, and even make publicationready graphics. Your imagination is your only limit.

• scan range XY:> 90 μm
• closed-loop position control with sensor noise < 1 nm (sensor non-linearity < 0,5 % at full scan)
• Z range:> 15 microns, sensor noise <0.4 nm in a 10 kHz BW
• operating modes: Contact, Non-Contact AC, Intermittent Contact (Q-Control, Phase, Amplitude), Force Mode, Force Volume, Lateral Force, Nanolithography, MFM and EFM
• Cantilever holder for operation in air and liquid environment (open configuration)
• Built-in cantilever force calibration capability based on thermal noise spectroscopy

• Base for MFP-3D stand alone AFM including micrometer driven flat-travel slide stage for sample positioning and top-down optical access to tip and sample.

• HVA 220 High Voltage Amplifier
• HV cantilever holder
• HV sample holder
• 70 Electri-Lever

• Isolation: dynamic 0.6 Hz to 100 kHz
• Absorption: above 5 Hz:> 25 dB, above 10 Hz:> 40 dB Acoustic Enclosure
• Enclosure designed for ultra-sensitive equipment, such as AFMs
• Up to 40 dB of acoustic isolation