National Institute Of Materials Physics - Romania
Publications
281. Low value for the static background dielectric constant in epitaxial PZT thin films
Published: OCT 11 2019, SCIENTIFIC REPORTS, 9, DOI: 10.1038/s41598-019-51312-8
282. Fabrication and characterization of Si1-xGex nanocrystals in as-grown and annealed structures: a comparative study
Published: SEP 17 2019, BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 10, 1882, DOI: 10.3762/bjnano.10.182
283. Efficacy of annealing and fabrication parameters on photo-response of SiGe in TiO2 matrix
Published: SEP 6 2019, NANOTECHNOLOGY, 30, DOI: 10.1088/1361-6528/ab260e
284. Nanoclustered Pd decorated nanocrystalline Zn doped SnO2 for ppb NO2 detection at low temperature
Published: SEP 1 2019, SENSORS AND ACTUATORS B-CHEMICAL, 294, 156, DOI: 10.1016/j.snb.2019.05.033
285. Conductance Model for Single-Crystalline/Compact Metal Oxide Gas-Sensing Layers in the Nondegenerate Limit: Example of Epitaxial SnO2(101)
Published: SEP 2019, ACS SENSORS, 4, 2428, DOI: 10.1021/acssensors.9b01018
286. Formation peculiarities and optical properties of highly-doped (Y(0.86)La(0.09)Vb(0.05))(2)O-3 transparent ceramics
Published: SEP 2019, CERAMICS INTERNATIONAL, 45, 16007, DOI: 10.1016/j.ceramint.2019.05.111
287. Dramatic impact of pressure and annealing temperature on the properties of sputtered ferroelectric HZO layers
Published: AUG 2019, APL MATERIALS, 7, DOI: 10.1063/1.5110894
288. 3D hybrid structures based on biomimetic membranes and Caryophyllus aromaticus - "green" synthesized nano-silver with improved bioperformances
Published: AUG 2019, MATERIALS SCIENCE & ENGINEERING C-MATERIALS FOR BIOLOGICAL APPLICATIONS, 101, 137, DOI: 10.1016/j.msec.2019.03.069
289. Rapid thermal annealing for high-quality ITO thin films deposited by radio-frequency magnetron sputtering
Published: JUL 25 2019, BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 10, 1522, DOI: 10.3762/bjnano.10.149
290. Ge nanoparticles in SiO2 for near infrared photodetectors with high performance
Published: JUL 16 2019, SCIENTIFIC REPORTS, 9, DOI: 10.1038/s41598-019-46711-w
Copyright © 2025 National Institute of Materials Physics. All Rights Reserved