National Institute Of Materials Physics - Romania
Publications
801. In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates
Published: MAR 2001, JOURNAL OF MATERIALS RESEARCH, 16, 708, DOI: 10.1557/JMR.2001.0121
802. Fourth-order zero-field splitting parameters of [Mn(cyclam)Br-2]Br determined by single-crystal W-band EPR
Published: 2001, APPLIED MAGNETIC RESONANCE, 21, 596, DOI: 10.1007/BF03162431
803. The influence of the h-BN morphology and structure on the c-BN growth
Published: MAR-JUL 2001, DIAMOND AND RELATED MATERIALS, 10, 1356, DOI: 10.1016/S0925-9635(00)00377-0
804. Point defects in cubic boron nitride crystals
Published: MAR-JUL 2001, DIAMOND AND RELATED MATERIALS, 10, 1411, DOI: 10.1016/S0925-9635(00)00396-4
805. Atomic 6p-Tl-0 centers in ferroelectric Rb2ZnCl4 crystals
Published: 2001, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 155, 377, DOI: 10.1080/10420150108214140
806. Internal structure of the nanosized sol-gel ITO thin films
Published: 2001, 2001 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOL 1 & 2, PROCEEDINGS, 66, DOI:
807. Multifrequency ESR studies of paramagnetic point defects in cubic boron nitride crystals
Published: 2001, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 156, 194, DOI: 10.1080/10420150108216892
808. X and Q-band ENDOR study of the Fe+(I) center in chlorinated Srcl(2) single crystals
Published: 2001, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 155, 111, DOI: 10.1080/10420150108214101
809. Traps in (nc-Si/CaF2)(50) nanostructures
Published: 2001, CAS: 2002 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 122, DOI:
810. Sr-ferrite thin films grown on sapphire by pulsed laser deposition
Published: DEC 15 2000, APPLIED SURFACE SCIENCE, 168, 113, DOI: 10.1016/S0169-4332(00)00612-7
Copyright © 2025 National Institute of Materials Physics. All Rights Reserved