National Institute Of Materials Physics - Romania

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articles found
831. Electron-hole recombination in PbCl2 : T1 crystals
Authors: Nistor, SV; Stefan, M; Goovaerts, E; Schoemaker, D

Published: MAY 2000, JOURNAL OF LUMINESCENCE, 87-9, 551, DOI: 10.1016/S0022-2313(99)00287-2

832. Structural investigation of a La0.6Y0.07Ca0.33MnO3 thin film by high resolution transmission electron microscopy
Authors: Ghica, C; Nistor, LC; Teodorescu, VS; Valeanu, M; Ristoscu, C; Mihailescu, IN; Deville, JP; Werckmann, J

Published: MAR 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 72, DOI:

833. Structural comparison between La0.60Y0.07Ca0.33MnO3-delta bulk and pulsed laser deposited thin films
Authors: Teodorescu, VS; Nistor, LC; Valeanu, M; Ghica, C; Sandu, C; Mihailescu, IN; Ristoscu, C; Deville, JP; Werckmann, J

Published: MAR 2000, JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 211, 60, DOI: 10.1016/S0304-8853(99)00713-1

834. Optical characterization of dielectric borophosphosilicate glass
Authors: Gartner, M; Modreanu, M; Bosch, S; Stoica, T

Published: APR-MAY 2000, MICROELECTRONICS RELIABILITY, 40, 620, DOI: 10.1016/S0026-2714(99)00291-7

835. EPR observation of first point defects in cubic boron nitride crystalline powders
Authors: Nistor, SV; Stefan, M; Schoemaker, D; Dinca, G

Published: 2000, SOLID STATE COMMUNICATIONS, 115, 44, DOI: 10.1016/S0038-1098(00)00135-6

836. Electrical properties of nanocrystalline porous silicon
Authors: Ciurea, ML; Iancu, V

Published: 2000, 2000 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, CAS 2000 PROCEEDINGS, 64, DOI: 10.1109/SMICND.2000.890188

837. Characterization of ITO thin films prepared by spinning deposition starting from a sol-gel process
Authors: Stoica, TF; Stoica, TA; Zaharescu, M; Popescu, M; Sava, F; Popescu-Pogrion, N; Frunza, L

Published: 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 688, DOI:

838. Room-temperature light-emitting diodes with Ge islands
Authors: Vescan, L; Chretien, O; Stoica, T; Mateeva, E; Muck, A

Published: OCT-DEC 2000, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 3, 387, DOI: 10.1016/S1369-8001(00)00059-7

839. Microstructural aspects related to carriers transport properties of nanocrystalline porous silicon films
Authors: Ciurea, ML; Teodorescu, VS; Nistor, LC; Blanchin, MG

Published: SEP 1999, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146, 3521, DOI: 10.1149/1.1392507

840. Weak localization effects in ZnO surface wells
Authors: Goldenblum, A; Bogatu, V; Stoica, T; Goldstein, Y; Many, A

Published: AUG 15 1999, PHYSICAL REVIEW B, 60, 5838, DOI: 10.1103/PhysRevB.60.5832



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