National Institute Of Materials Physics - Romania

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articles found
831. Growth of carbon nickel multilayer for X-ray-UV optics by RF reactive magnetron sputtering
Authors: Georgescu, G; Nelea, V; Ulmeanu, M; Ghica, C; Nastase, N

Published: JUL 1999, APPLIED SURFACE SCIENCE, 148, 146, DOI: 10.1016/S0169-4332(99)00219-6

832. Transmission electron microscopy study of thin films and surface implanted wafers of LiNbO3
Authors: Teodorescu, VS; Ghica, C; Blanchin, MG; Moretti, P

Published: JUN 1999, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 1, 48, DOI:

833. Multilayer structures deposited by laser ablation
Authors: Dinescu, M; Stanciu, C; Ghica, D; Dinu, R; Sandu, V; Nastase, N; Balucani, M; Bondarenko, V; Frachina, L; Lamedica, G; Ferrari, A

Published: APR 20 1999, SENSORS AND ACTUATORS A-PHYSICAL, 74, 30, DOI: 10.1016/S0924-4247(98)00331-8

834. Growth of pure and doped Rb2ZnCl4 and K2ZnCl4 single crystals by Czochralski technique
Authors: Stefan, M; Nistor, SV; Mateescu, DC; Abakumov, AM

Published: APR 1999, JOURNAL OF CRYSTAL GROWTH, 200, 154, DOI: 10.1016/S0022-0248(98)01247-0

835. ESR of paramagnetic atom defects in CVD-grown diamond
Authors: Nistor, SV; Stefan, M; Ralchenko, V; Goovaerts, E; Schoemaker, D

Published: 1999, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 149, 307, DOI: 10.1080/10420159908230172

836. ESR of trapped-electron Fe+ centres in chlorinated SrCl2 crystals
Authors: Nistor, SV; Stefan, M; Bouwen, A; Schoemaker, D

Published: 1999, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 149, 207, DOI: 10.1080/10420159908230156

837. ESR of paramagnetic Tl2+-type centres in Rb2ZnCl4 crystals
Authors: Stefan, M; Nistor, SV; Schoemaker, D

Published: 1999, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 150, 368, DOI: 10.1080/10420159908226258

838. Room-temperature SiGe light-emitting diodes
Authors: Vescan, L; Stoica, T

Published: DEC 1998, JOURNAL OF LUMINESCENCE, 80, 489, DOI: 10.1016/S0022-2313(98)00160-4

839. Investigation of the W-74 L emission spectra and satellites
Authors: Vlaicu, AM; Tochio, T; Ishizuka, T; Ohsawa, D; Ito, Y; Mukoyama, T; Nisawa, A; Shoji, T; Yoshikado, S

Published: NOV 1998, PHYSICAL REVIEW A, 58, 3551, DOI: 10.1103/PhysRevA.58.3544

840. Quantum confinement model for electric transport phenomena in fresh and stored photoluminescent porous silicon films
Authors: Iancu, V; Ciurea, ML

Published: OCT 1998, SOLID-STATE ELECTRONICS, 42, 1896, DOI: 10.1016/S0038-1101(98)00160-9



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