National Institute Of Materials Physics - Romania

Atomic Structures and Defects in Advanced Materials Laboratory

Facilities and Services

1. Analytical Atomic Resolution Electron Microscope JEM-ARM200F (JEOL)

Configuration Field Emission Gun (FEG) Cs-corrector for STEM mode STEM Unit EDS Unit: JEOL JED-2300T EELS and Image Filter: Gatan Quantum SE CCD Cameras: Gatan Orius 200D – wide angle port Gatan Ultrascan 1000XP -bottom mounted Gatan Ultrascan 1000FT – GIF camera Working modes CTEM, HRTEM, STEM BF, STEM ADF, STEM ,HAADF, SAED, nano-ED, CBED, […]

2. Pulsed Fourier Transform X-band ESR spectrometer (Bruker ELEXSYS E580, 2010) with pulse ENDOR (E560 DICE II) and ELDOR (E580-400) accessories

Operating parameters:  Microwave frequency range: 9.2- 9.9 GHz (CW mode) RF range and power (for ENDOR measurements): 100kHz – 250 MHz; 150W Magnetic field range: 0.03 to 1.45 T Sensitivity (CW mode): 1.2 x 109 spins/Gauss Pulse resolution: 1nsec Microwave peak power (Pulse mode only): max. 1kW Temperature: 3.8 – 300 K Available experiments:  CW […]

3. High-Resolution analytical transmission electron microscope with accessories for in-situ experiments and electron tomography

A multifunctional tool designed for the research and characterization of advanced materials, used for the following types of studies: conventional transmission electron microscopy, high-resolution transmission electron microscopy, electron tomography, in-situ electron microscopy at high or low (cryogenic) temperature, energy dispersive X-ray spectroscopy, elemental chemical mapping. TECHNICAL SPECIFICATIONS Scanning Transmission Electron Microscopy (STEM) unit with Annular […]

Back to top

Copyright © 2022 National Institute of Materials Physics. All Rights Reserved