National Institute Of Materials Physics - Romania

Atomic Structures and Defects in Advanced Materials (LASDAM)

Our research is mainly directed towards the investigation and manipulation of physical properties at nanometric and atomic scale for the development of new materials (dielectrics, semiconductors, alloys, ceramics) for applications in the semiconductor industry (gas sensors, optical sensors, memories, radiation detectors), telecommunications, energy conversion, health and environment.

We use modern physical and chemical methods for nanomaterials synthesis, thin film deposition and device manufacturing, and we apply advanced techniques for the in-depth characterization of the microstructural, optical, electronic and magnetic properties of the created materials and devices.

Our laboratory acts as Partner Facility within the CERIC-ERIC European consortium, offering Open Access to state-of-the-art instrumentation to academic or industrial users worldwide, by semesterly calls.

Approached systems and topics:

  • Thin films and multilayered structures based on SiGeSn nanoparticles embedded in dielectric matrices (HfO2, ZrO2, SiO2, TiO2, Al2O3, Si3N4) for SWIR photodetectors and non-volatile memories;
  • 2D transition metal dichalcogenides materials and heterojunctions with electro-optic properties for health and environment applications;
  • Metal oxides for gas sensing, photocatalysis, batteries, biomedical and environment-related applications;
  • Investigation of atomic structures, interfaces, phase transitions, extended and point defects by microstructural (HRTEM, XRD), spectroscopic (EPR, EELS) and optical methods for structure-functionality correlations in advanced materials (nanoparticles, thin films, ceramics and special alloys).

Techniques and expertise available for materials synthesis, processing and characterization:

  • Analytical Transmission and Scanning Electron Microscopy – open access via CERIC-ERIC.
  • Multifrequency Electron Paramagnetic Resonance spectroscopy - open access via CERIC-ERIC.
  • X-ray diffraction (XRD) on powder and thin film samples
  • Complex electrical measurements in variable conditions: under controlled gas atmosphere, in dark or under illumination, Hall effect measurements and modelling of experimental curves;
  • Optical spectroscopy.
  • Magnetron sputtering deposition of thin films and multilayers;
  • Rapid thermal annealing (RTA) and controlled oxidations (RTO);

Preparation of nanocrystalline materials by co-precipitation, solvothermal method and high energy ball milling.


Latest Publications

Annealing temperature, a key factor in shaping Ag-decorated TiO2 aerogels as efficient visible-light photocatalysts
Authors: Rostas, AM; Suciu, RC; Rosu, MC; Turza, A; Cosma, DV; Tripon, S; Fort, CI; Danciu, V; Baia, M; Bocirnea, A; Indrea, E

Published: JUN 1 2025, MATERIALS CHEMISTRY AND PHYSICS, 337, 130557, DOI: 10.1016/j.matchemphys.2025.130557

Exploring the Synthesis of Cu2(Zn,Cd)SnS4 at High Temperatures as a Route for High-Efficiency Solar Cells
Authors: El Khouja, O; Gong, YC; Jimenez-Arguijo, A; Guerra, MJ; Medaille, AG; Scaffidi, R; Basak, A; Radu, C; Flandre, D; Vermang, B; Giraldo, S; Placidi, M; Li-Kao, ZJ; Galca, AC; Saucedo, E

Published: MAY 2025, PROGRESS IN PHOTOVOLTAICS, 33, DOI: 10.1002/pip.3899

Effect of molecular adsorption on the conductivity of selectively grown, interconnected 2D-MoS2 atomically thin flake structures
Authors: Stavarache, I; Palade, C; Slav, A; Dascalescu, I; Lepadatu, AM; Matei, E; Besleaga, C; Ciurea, ML; Kardynal, BE; Stoica, T

Published: APR 8 2025, NANOSCALE ADVANCES, 7, DOI: 10.1039/d5na00138b

Synthesis of dynamic N-acylhydrazone-based macrocycles
Authors: Sandu, N; Hanganu, A; Popescu, C; Demeter, AM; Mirea, AG; Kuncser, A; Tablet, C; Hadade, ND; Florea, M; Funeriu, DP; Matache, M

Published: APR 1 2025, JOURNAL OF MATERIALS CHEMISTRY A, 13, DOI: 10.1039/d4ta09035g

Enhancement of luminescence of ZnS:Ag treated in low power radio frequency argon plasma and excited with an electron beam at 13 keV
Authors: Scurtu, A; Dumitru, M; Garoi, P; Banici, AM; Radu, C; Ticos, D; Udrea, N; Mitu, ML; Ticos, CM

Published: MAR 15 2025, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 188, 109259, DOI: 10.1016/j.mssp.2024.109259


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