National Institute Of Materials Physics - Romania
Publications
391. Performance studies of the CMS Strip Tracker before installation
Published: JUN 2009, JOURNAL OF INSTRUMENTATION, 4, P06009, DOI: 10.1088/1748-0221/4/06/P06009
392. Stand-alone cosmic muon reconstruction before installation of the CMS silicon strip tracker
Published: MAY 2009, JOURNAL OF INSTRUMENTATION, 4, P05004, DOI: 10.1088/1748-0221/4/05/P05004
393. Band ferromagnetism in systems of variable dimensionality II: the two-dimensional finite-temperature case
Published: APR 2009, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 11, DOI:
394. XPS analysis of n-GaP(111) native and etched surfaces
Published: APR 2009, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 11, 390, DOI:
395. Total oxidation of toluene on ferrite-type catalysts
Published: MAR 30 2009, CATALYSIS TODAY, 141, 366, DOI: 10.1016/j.cattod.2008.05.005
396. Radiofrequency plasma beam deposition of various forms of carbon based thin films and their characterization
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5381, DOI: 10.1016/j.apsusc.2008.08.042
397. Thin films of Cu(II)-o,o '-dihydroxy azobenzene nanoparticle-embedded polyacrylic acid (PAA) for nonlinear optical applications developed by matrix assisted pulsed laser evaporation (MAPLE)
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5485, DOI: 10.1016/j.apsusc.2008.10.012
398. Preparation and characterization of nitrogen-doped TiO2 nanoparticles by the laser pyrolysis of N2O-containing gas mixtures
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5377, DOI: 10.1016/j.apsusc.2008.08.046
399. Photonic molecular effects associated to the sputtering process in a glow discharge optical emission spectrometer
Published: JAN 2009, OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, 3, 43, DOI:
400. EXAFS investigation of iron local environment in metal-doped titania photocatalysts prepared by hydrothermal and high-energy ball milling routes
Published: JAN 2009, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 20, 215, DOI: 10.1007/s10854-007-9541-9
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