National Institute Of Materials Physics - Romania

Atomic Structures and Defects in Advanced Materials (LASDAM)

Facilities and Services

Specifications Appropriate optical filters can be installed in the Photoacoustic multi-gas monitor INNOVA 1314 filter carousel so that it can selectively measure the concentration of up to 5 component gases and water vapor. Description It is used for evaluation of the catalytic activity exhibited by the substrate, electrodes, and sensitive material. By subtracting the first […]

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Keithley 6517A specifications: Resistance: 10 Ω – 200 TΩ Current: 100 aA – 20 mA Voltage: 10 µV – 200 V Charge: 10 fC – 2 µC Integrated ±1 kV voltage source with ±10 mA maximum output current. The integrated Keithley 6521 low current scanner is used to measure up to 10 channels simultaneously. Keithley […]

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Precise gas flow control is crucial for acquiring accurately gas concentrations. Therefore mass flow controllers must be periodically calibrated using Alltech DFC. Calibrated Testo 625 thermo hygrometer is used to check the relative humidity accuracy through the flow system.

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Description Within the sensors chambers up to four gas sensors with different electrodes configurations can be simultaneously exposed to the gas atmosphere. Subsequent Teflon sockets and stainless steel electrical contacts are used for DC measurements and sensor’s temperature control. The two parts of the chamber, the main body and the cover are sealed using Viton […]

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Specifications Carrier gas : synthetic air (5.0 purity) with controllable relative humidity (RH: 0–90%) and flow (10–200 ml/min); Test gases: CO, CH4, NO2, H2S, NH3, SO2 Description Flow system is used to dose different target gas concentrations under dynamic regime. It consists of eleven individual channels (dry synthetic air, humid synthetic air, NO2, CO, CH4, […]

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UV-VIS double beam spectrophotometer, model Specord 250 Plus, Analytik Jena Operating parameters: Spectral range: 190 – 1100 nm; Wavelength accuracy: ± 0.1 nm; Variable spectral bandwidth: 0.5 nm, 1 nm, 2 nm, 4 nm; Acquisition & control software: WinAspect; Diffuse reflectance accessory with integrating sphere.   Available experiments: Absorbance, Transmittance, Energy, Reflectance; Spectral scan; Time […]

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Compact EPR Spectrometer CMS 8400 from ADANI Systems Operating parameters: Compact: Portable, full computer control; Frequency: 9.2 – 9.5 GHz; Sensitivity: 1011 spins/Gauss; Field range: 0.05 – 0.6 T; Solid and liquid samples.

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CW Q-band EPR spectrometer model ELEXSYS E500 from Bruker with E560 ENDOR accessory Operating parameters: Frequency: 34 GHz; Sensitivity: 109 spins/Gauss; Magnetic field: 0.03 – 1.8 T; Effective RF range: 1 – 250 MHz; Temperature: 5 – 300 K; Available CW EPR experiments: Q-band EPR; Electron-Nuclear Double Resonance (ENDOR); ENDOR induced EPR (EIE); TRIPLE resonance.

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CW X-band EPR spectrometer model EMXplus from Bruker (upgraded Varian E12) Operating parameters: Frequency range: 9.2 – 9.9 GHz; Sensitivity: 1010 spins/Gauss; Magnetic field: 0.03 – 1.8 T; Temperature: 90 – 300 K.  

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  Machines: Wire saw Lapping machines Zeiss Axio Observer reversed metallographic microscope for monitoring the thinning/polishing stages Zeiss Stemi 2000 stereoscopic optical microscope for TEM specimen manipulation Gatan PIPS ion milling installations JEOL JEE 4C vacuum evaporator Gatan ultrasound disc cutter Gatan Dimple Grinder

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