Aberration corrected analytical instrument designed for atomic resolution characterization of advanced materials by imaging (HRTEM, STEM) and spectroscopic (EELS, EDS) methods. Configuration: Schottky Field Emission Gun (FEG), CEOS spherical aberration corrector for STEM mode, STEM Unit, Gatan Quantum SE EELS and Image Filter, JEOL JED-2300T EDS unit, Gatan Orius 200D CCD (wide angle port), Gatan […]
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A multifunctional tool, designed for the research and characterization of advanced materials, used for the following types of studies: conventional TEM, HRTEM, STEM, electron tomography, precession electron diffraction (PED), in-situ TEM at high or cryogenic temperatures, energy dispersive X-ray spectroscopy, elemental chemical mapping. Configuration: LaB6 gun, STEM unit, JEOL JED-2300T Dry SDD EDS unit, emSIS […]
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A multifunctional instrument, provided with imaging (FEG-SEM), ion-beam processing (FIB), analytical (EDS) and electron diffraction (EBSD) capabilities for advanced characterization of microscopic morphology, elemental composition, chemical mapping and surface structural mapping. Configuration: FEG-SEM (Schottky gun), FIB (Orsay Physics), EDS (Bruker Quantax 200), EBSD (Bruker e-Flash 1000) Technical specifications: SEM acceleration voltages 0.2-30 kV; SE and […]
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Available instruments: diamond wire saw (MTI), ultrasound disc cutter (Gatan), dimple grinder (Gatan), lapping machines (MTI), ion milling (Gatan PIPS), reversed metallographic microscope (Zeiss Axio Observer), stereoscopic optical microscope (Zeiss Stemi 2000), vacuum evaporators (JEOL).
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