National Institute Of Materials Physics - Romania

A complex cluster for surface and interface science (Specs, Fig. 3), delocalized actually on the SuperESCA beamline at the Elettra synchrotron radiation facility in Trieste (Combined Spectroscopy and Microscopy on a Synchrotron – CoSMoS), composed by: (i) a chamber for photoelectron spectroscopy (XPS, ESCA, UPS, AES) with angle and spin resolution (ARPES, XPD, ARUPS, SR-UPS); […]

A complex cluster for surface and interface science (Specs, Fig. 1), composed by: (i) a chamber for photoelectron spectroscopy (XPS, ESCA, UPS, AES); (ii) a molecular beam epitaxy (MBE) chamber with in situ follow-up by low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED) and residual gas analysis; (iii) a chamber for […]

An installation for X-ray photoelectron spectroscopy with possibilities of restricted area analyses (lateral resolution 2 mm) and automated change of samples / measuring areas, coupled to a reaction cell at high pressures (4 bar) and temperatures (1000 °C) (Kratos, Fig. 2).  

An installation for low energy and photoemission electron microscopy: LEEM – PEEM, micro LEED, micro ARUPS (Specs, Fig. 4). The installation is able to perform simultaneous imaging (i. e. without scanning) of surfaces by using low energy electrons or photoelectrons produced by UV radiation. In the LEEM mode, the lateral resolution is about 5 nm, […]

Setup for laboratory extended X-ray absorption fine structure (EXAFS, Rigaku, Fig. 5). Excitations: Mo Ka1 (17479.34 eV), W La1 (8397.6 eV), power 3 kW (40 kV, 75 mA); Ge(220), Ge(400), Ge(840) monochromators; detectors: proportional counters, scintillation detectors; measurement in transmission or fluorescence; simulation and analysis software.