Multimethod system for surface analysis (XPS, MBE, STM)

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Multimethod system for surface analysis (XPS, MBE, STM)

A complex cluster for surface and interface science (Specs, Fig. 1), composed by: (i) a chamber for photoelectron spectroscopy (XPS, ESCA, UPS, AES); (ii) a molecular beam epitaxy (MBE) chamber with in situ follow-up by low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED) and residual gas analysis; (iii) a chamber for scanning tunneling microscopy and spectroscopy (STM/STS); (iv) load-lock and storage of samples in ultrahigh vacuum.

Figure 1. The first cluster of surfaces and interfaces (the „multi-method system” coupled to MBE), located in NIMP. Produced by Specs, Berlin, Germany.


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