1. Structural characterization by near infrared (NIR), infrared (midIR) and far infrared (farIR) Fourier transform infrared (FTIR) spectrometry
2. Surface investigation by scanning probe microscopy (SPM)
3. X-ray diffraction systems
4. Specimen Preparation
5. THEMYS ONE TG-DTA/DSC analyzer, SETARAM INSTRUMENTATION, FRANCE
6. TPDRO 1100, POROTEC, Thermo Scientific, Analytical system for material characterisation using cumulative characterisation techniques such as TPD, TPR, TPO, pulse chemosorption and single point BET
7. Extended X-ray absorption fine structure (EXAFS)
8. Scanning electron microscope Evo 50 XVP with EDAX attachment (Carl Zeiss NTS )
9. Mossbauer Spectrometer with magnetic field, ultralow temperature cryostat (Engelmann Scientific)
10. X-ray absorption fine structure spectrometer (Rigaku)
Back to top
Copyright © 2023 National Institute of Materials Physics. All Rights Reserved