1. Analytical Atomic Resolution Electron Microscope JEM-ARM200F (JEOL)
2. Scanning electron microscope Evo 50 XVP with EDAX attachment (Carl Zeiss NTS )
3. Atomic Force Microscope AFM/PFM MFP-3D-SA (Asylum Research)
4. X-ray Diffractometer, D8 ADVANCE type (BRUKER-AXS)
5. Mossbauer Spectrometer with magnetic field, ultralow temperature cryostat (Engelmann Scientific)
6. Pulsed Fourier Transform X-band ESR spectrometer (Bruker ELEXSYS E580, 2010) with pulse ENDOR (E560 DICE II) and ELDOR (E580-400) accessories
7. X-ray absorption fine structure spectrometer (Rigaku)
8. High-Resolution analytical transmission electron microscope with accessories for in-situ experiments and electron tomography
Back to top
Copyright © 2019 National Institute of Materials Physics. All Rights Reserved