1. Structural characterization by near infrared (NIR), infrared (midIR) and far infrared (farIR) Fourier transform infrared (FTIR) spectrometry
2. Surface investigation by scanning probe microscopy (SPM)
3. X-ray diffraction systems
4. Specimen Preparation
5. JEM 2100
6. THEMYS ONE TG-DTA/DSC analyzer, SETARAM INSTRUMENTATION, FRANCE
7. TPDRO 1100, POROTEC, Thermo Scientific, Analytical system for material characterisation using cumulative characterisation techniques such as TPD, TPR, TPO, pulse chemosorption and single point BET
8. Extended X-ray absorption fine structure (EXAFS)
9. Scanning Electron Microscope Lyra 3XMU with Focused Ion Beam SEM-FIB sample preparation system (Tescan) with EBSD and EDS analysis systems (Bruker)
10. Analytical Atomic Resolution Electron Microscope JEM-ARM200F (JEOL)
Back to top
Copyright © 2023 National Institute of Materials Physics. All Rights Reserved