Facilities

1
Structural characterization by near infrared (NIR), infrared (midIR) and far infrared (farIR) Fourier transform infrared (FTIR) spectrometry
2
Surface investigation by scanning probe microscopy (SPM)
3
X-ray diffraction systems
4
Specimen Preparation
5
THEMYS ONE TG-DTA/DSC analyzer, SETARAM INSTRUMENTATION, FRANCE
6
TPDRO 1100, POROTEC, Thermo Scientific, Analytical system for material characterisation using cumulative characterisation techniques such as TPD, TPR, TPO, pulse chemosorption and single point BET
7
Extended X-ray absorption fine structure (EXAFS)
8
Scanning electron microscope Evo 50 XVP with EDAX attachment (Carl Zeiss NTS )
9
Mossbauer Spectrometer with magnetic field, ultralow temperature cryostat (Engelmann Scientific)
10
X-ray absorption fine structure spectrometer (Rigaku)