1. Experimental Cluster for Surface and Interface Science
2. Low energy and Photoelectron Electron Microscope LEEM-PEEM (Specs)
3. Scanning Microscopy Station SPM (NT-MDT)
4. Ultra High Vacuum System for XPS/UPS/AES (Specs)
5. Gas chromatograph with GC-MS mass spectrometer
6. XPS photoelectron spectroscopy unit with facilities for treatment of samples at high pressure and temperature
Back to top
Copyright © 2019 National Institute of Materials Physics. All Rights Reserved