National Institute Of Materials Physics - Romania
Publications
591. Radiofrequency plasma beam deposition of various forms of carbon based thin films and their characterization
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5381, DOI: 10.1016/j.apsusc.2008.08.042
592. Pulsed-laser deposition of smooth thin films of Er, Pr and Nd doped glasses
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5298, DOI: 10.1016/j.apsusc.2008.10.038
593. Structural investigations of ITO-ZnO films grown by the combinatorial pulsed laser deposition technique
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5291, DOI: 10.1016/j.apsusc.2008.07.120
594. Advanced electrical characterization of ferroelectric thin films: facts and artifacts
Published: MAR 2009, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 11, 228, DOI:
595. Study of the Radiation Hardness of Silicon Sensors for the XFEL
Published: 2009, 2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9, +, DOI:
596. Ba(Zn1/3Ta2/3)O-3 Ceramics for Microwave and Millimeter-wave Applications
Published: 2009, INTERDISCIPLINARY TRANSPORT PHENOMENA: FLUID, THERMAL, BIOLOGICAL, MATERIALS, AND SPACE SCIENCES, 1161, 553, DOI: 10.1111/j.1749-6632.2008.04077.x
597. Dielectric Properties of Paraelectric Ba1-xSrxTiO3 Ceramics
Published: 2009, FERROELECTRICS, 391, 41, DOI: 10.1080/00150190903001086
598. STRUCTURAL AND OPTICAL PROPERTIES OF SOL-GEL DERIVED HYDROXYAPATITE FILMS IN DIFFERENT STAGES OF CRYSTALLIZATION AND DENSIFICATION PROCESSES
Published: 2009, NANOSTRUCTURED MATERIALS AND NANOTECHNOLOGY II, 29, +, DOI:
599. The Influence of the Electrode Type on the Electric-Ferroelectric Properties of Sandwich PbZr0.2Ti0.8O3-BiFeO3-PbZr0.2Ti0.8O3 Structure
Published: 2009, FERROELECTRICS, 391, 66, DOI: 10.1080/00150190903001235
600. Interface States in 4H-and 6H-SiC MOS Capacitors: a Comparative Study between Conductance Spectroscopy and Thermal Dielectric Relaxation Current Technique
Published: 2009, SILICON CARBIDE AND RELATED MATERIALS 2008, 615-617, 500, DOI: 10.4028/www.scientific.net/MSF.615-617.497
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