National Institute Of Materials Physics - Romania

Barium strontium titanate (BST) bulk ceramic was used as target for PLD thin film deposition. In order to avoid stoichiometry modification during the deposition, a more reactive oxidant ambient in the chamber was produced by rising a radiofrequency discharge 13.56 MHz, 150 W. Thin films of stoichiometric BST was deposited on alumina substrate with the thickness between 400 and 500 nm heated at 650 degrees C. An aditional anealing was made at 800 degrees C for 6 hours. XRD and SEM were used for sample characterization. Capacity measurements at 100 kHz were performed versus temperature.

In the present investigation we studied the effect of lead content on a hard type ceramics starting from lack to excess PbO. Specimens of Pb-x(Mn0.017Sb0.033Zr0.48Ti0.47)O-3 with 0.96 <= x <= 1.06 were prepared by conventional oxide mixing technique and sintered at temperatures between 1280 and 1350 degrees C. In samples with lower Ph concentration the pyrochlore phase appeared, while in those with higher Pb an excess of PbO phase was detected. These phases proved detrimental for the properties of sintered ceramics. The highest values of piezoelectric properties were observed only for samples with an excess lead of about 2% sintered at 1340 degrees C, indicating that it represents the optimum amount of PbO. For such samples, the density p was 7.77 g/cm (3). the remnant polarization P, was 37 mu C/cm(3) the planar coupling coefficient k(P) was 0.57 and the charge constant d(33) was 340 C-P/N. (c) 2007 Elsevier Ltd. All rights reserved.

A comparative study of photodetector performance for nano- and micro-crystalline PbS thin layers is presented Both types of PbS films were obtained using the Chemical Bath Deposition method. To prepare nano-crystalline thin films we used a short reaction time with no doping Bi added At low levels of irradiance (0.1 mW/cm(2)) and room temperature (RT), the macro-crystalline PbS outperforms its nano-crystalline counterpart, by a factor of 6 for the value of Delta R/R-dark. However the nano-crystalline photodetectors show significantly lower optical quenching for large values of irradiance (approximate to 500 mW/cm(2)) at RT and better Delta R/R-dark performance at lower temperature, with an optimum temperature Of 150 K. The low frequency noise behavior is a superposition of 1/f flicker noise at low frequency and generation-recombination and thermal noise at higher frequency. The proportionaliiy factor between the 1/f noise and the DC dark current for the series resistor is 1.5 times larger for the nano-crystalline photodetector at room temperature.

Three types of materials for dielectric resonators are presented in this paper. The Pb-BNT materials show the highest dielectric constant (similar to 85). A very small controllable temperature coefficient if in the range (-2 divided by +4) ppm/degrees C can be achieved by using dielectric resonators Mg-(Zr0.8Sn0.2)TiO4. On the other hand, the resonators made of Ba(Zn1/3Ta2/3)O-3 exhibit the highest values for the Qxf product, ranging from 50000 to 130000 GHz, which make them attractive for millimetre wave applications.

Diodes processed on n-type epitaxial silicon with a thickness of 25, 50 and 75 mu m had been irradiated with reactor neutrons and high-energy protons (24 GeV/c) up to integrated fluences of Phi(eq) = 10(16) cm(-2). Systematic experiments on radiation-induced damage effects revealed the following results: in contrast to standard and oxygen-enriched float zone (FZ) silicon devices no space charge sign inversion was observed after irradiation. It is shown that the radiation-generated concentration of deep acceptors, dominating the behavior of n-type FZ diodes, is compensated by creation of shallow donors. Thus a positive space charge is maintained throughout the irradiation up to the highest fluence and even during prolonged elevated-temperature annealing cycles. Defect analysis studies using thermally stimulated current measurements attribute the effect to a damage-induced shallow donor at E-C-0.23 eV. It is argued that, as in the case of thermal donors, oxygen dimers, out diffusing from the Cz substrate during the diode processing, are responsible precursers. Results from extensive annealing experiments at elevated temperatures are verified by comparison with prolonged room-temperature annealing. These results showed that in contrast to FZ detectors, which always have to be cooled, room-temperature storage during beam off periods of future elementary particle physics experiments would even be beneficial for n-type epi-silicon detectors. A dedicated experiment at CERN-PS had successfully proven this expectation. It was verified, that in such a scenario the depletion voltage for the epi-detector could always be kept at a moderate level throughout the full S-LHC operation (foreseen upgrade of the large hadron collider). Practically no difference with respect to FZ-silicon devices was found in the damage-induced bulk generation current. The charge trapping measured with Sr-90 electrons (mip's) is also almost identical to what was expected. A charge collection efficiency of 60% (2500 e) in 50 mu m n-type epi-diodes after 24 GeV/c proton irradiation with Phi(eq) = 6.2 x 10(15) cm(-2) was reported recently, independent of the operating temperature down to -20 degrees C. (c) 2006 Elsevier B.V. All rights reserved.

Pure and L-alanine doped Triglycine sulphate (TGS) crystals were grown in paraelectric phase (similar to 52 degrees C). Doped crystals show unequal growth rates along the ferroelectric axis. Pure TGS crystals show peculiar dielectric behavior in the ferroelectric phase, after crossing up and down the Curie point in two successive runs between room temperature and 80 degrees C. Much higher and unstable permittivity was found returning in the ferroelectric phase. At constant temperature (35 degrees C), permittivity follows a relaxation process, characterized by two relaxation times. L-Alanine doped TGS crystal shows more than one order of magnitude smaller permittivity and dielectric losses. Internal bias field of similar to 1 kV/cm, induced by the dopant, made the crystal almost monodomain and pined polarization in one direction. Pyroelectric coefficient measurements were performed at constant heating rate of the samples, using a computer controlled He cryostat and Keithley 6517 electrometer. The temperature dependence of P+ polarization component, obtained by computer integration of the pyroelectric coefficient, was measured on a large temperature interval (-20/ +80 degrees C). Pyroelectric coefficient of the doped samples was also measured by the same procedure, using a dc bias electric field, pointing in the opposite direction to the pined polarization. The polarization could be reversed, on the whole temperature range, by dc fields higher than bias or coercive field. Surprisingly, for the first time, the pyroelectric coefficient (p) was found constant on quite large temperature intervals. Doped TGS crystals show much smaller values of permittivity epsilon(r) versus the pure one and consequently, get higher figure of merit M = p/epsilon(r). The pyroelectric coefficient of this material can be tailored to become constant on a defined temperature range, under a dc field control. This characteristic makes this material valuable to be used as pyroelectric material for IR devices. (c) 2006 Elsevier B.V. All rights reserved.

The (Zr0.8Sn0.2)TiO4 material (ZST), has been prepared by solid state reaction and characterized. The samples were sintered in the temperature range of 1260-1320 degrees C for 2 h. The effects of sintering parameters like sintering temperature (T-s) and MgO addition (0.2 wt.%) on structural and dielectric properties were investigated. Bulk density increases from 4900 to 5050 kg/m(3) with the increase of sintering temperature. The effect of MgO addition is to lower the sintering temperature in order to obtain well sintered samples with high value of bulk density. The material exhibits a dielectric constant epsilon(r) similar to 37 and high values of the Q x f product, greater than 45,000, at microwave frequencies. The dielectric properties make the ZST material very attractive for microwave applications such as dielectric resonators, filters, dielectric antennas, substrates for hybrid microwave integrated circuits, etc. (c) 2006 Elsevier B.V. All rights reserved.

Solid solutions Ba-1 (-) xSrxTiO3 (BST) are of high technological importance, particularly in microwave domain. Barium titanate has "naturally" three transitions, between four stable ferroelectric phases: (C) cubic, (T) tetragonal, (0) orthorhombic, (R) rhombohedral. Jaffe et al. [B. Jaffe, W.R. Cook, H. Jaffe, Piezoelectric Ceramics, Academic Press, 1971] has given the dependence of the transition temperatures up to 30% of Sr content. We have extrapolated these temperatures and we have found that some phases might disappear at higher Sr concentrations. A family of solid solutions with x = 25, 50, 75, 90% was prepared by standard solid-state reaction and sintered at 1230 and 1260 degrees C, respectively. The permitivities and the dielectric losses were measured with a self-acting bridge (1 kHz), on a large temperature range (+/- 200 degrees C). The composition x = 25% shows three peak values of permittivity as expected, while the composition x = 50%, only two peak values, corresponding to phase transitions cubic-tetragonal-rhombohedral, phase orthorhombic being excluded. Compositions with x >= 63%, Sr shows only one peak value corresponding to a genuine transition cubic-rhombohedral. The cubic transition to several lower phases shows almost a linear decrease of the Curie point with the increase of Sr fraction. For Sr concentration x >= 80%, the Curie point appears to fall more rapidly than linear. To our best knowledge, there is for the first time, this effect is reported. (c) 2006 Elsevier B.V. All rights reserved.

Shallow defect levels in floating zone (FZ) and diffusion oxygenated FZ (DOFZ) silicon, before and after irradiation with a Co-60 gamma-source up to 300 Mrad, have been studied by thermally stimulated currents (TSC) and deep level transient spectroscopy (DLTS) in the temperature range 4.2-110 K. Besides vacancy oxygen (VO) and interstitial-substitutional carbon (CiCs) emissions, several TSC peaks have been observed. A trap with an activation energy of 11 meV has been observed at 6 K only in irradiated DOFZ. Two hole traps at 80 meV and 95 meV have been observed both in irradiated FZ and DOFZ, while a trap at 100 meV, related to an interstitial-oxygen (IO2) complex, has been revealed only in irradiated DOFZ. A TSC peak close to 24 K has been resolved into two components, whose concentrations are independent of irradiation fluence: a trap at 55 meV and a level which remains charged after emission at 80 meV. Our measurements confirm the formation, only in DOFZ, of a radiation induced donor at 230 meV. It appears to be responsible for the improved radiation hardness of oxygenated Si together with the suppression of deep acceptors, since no shallower radiation-induced donors have been detected in DOFZ samples.

PbZr1-XTiXO3 (PZT) film was prepared by addition of polymer polyvinylpirrolidone (PVP) in the PZT precursor and hydrolysis of the PZT precursor sol. Porous thin films were prepared by spin coating on Pt-coated Si substrate. The structure of the films was investigated by X-ray diffraction (XRD). (100)-oriented PZT 20180 film was obtained by hydrolysis of sol. PVP addition leads to the (110)-orientation of the film. The surface microstructure of the films was characterised with Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The surface profile indicates a films roughness of 5 nm. No micro-cracks were observed on film surface. The average remnant polarization and the coercive field were obtained from the hysteresis loop measurements. The ferroelectric behavior has been evidenced by the presence of the butterfly shape of the capacitance-voltage characteristics. Experimental results show that the dielectric constant of the PZT porous film is lower than that of the dense film.