National Institute Of Materials Physics - Romania
Publications
841. Photoconductivity of SrBi2Ta2O9 thin films
Published: 1999, JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 19, 1488, DOI: 10.1016/S0955-2219(98)00460-9
842. Photoelectric effects in chemical solution deposited Bi4Ti3O12 thin films
Published: DEC 1998, JOURNAL DE PHYSIQUE IV, 8, 104, DOI: 10.1051/jp4:1998916
843. Theoretical background of the optical charging spectroscopy method used for investigation of trapping levels
Published: SEP 21 1998, APPLIED PHYSICS LETTERS, 73, 1687, DOI: 10.1063/1.122245
844. Bi4Ti3O12 ferroelectric thin film ultraviolet detectors
Published: JUL 20 1998, APPLIED PHYSICS LETTERS, 73, 344, DOI: 10.1063/1.121828
845. Investigation of deep impurity levels in high resistivity silicon using optical charging spectroscopy
Published: 1998, DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1997, 160, 296, DOI:
846. Electrical and optical characterization of PbTiO3/Si heterostructures for applications in optoelectronics
Published: 1998, FIFTH CONFERENCE ON OPTICS (ROMOPTO '97), PTS 1 AND 2, 3405, 851, DOI: 10.1117/12.312674
847. A model of the metallic surface-emitting second harmonic generator
Published: SEP 1997, IEEE JOURNAL OF QUANTUM ELECTRONICS, 33, 1480, DOI: 10.1109/3.622625
848. Indirect enhancement of PbS photoconductivity by ferroelectric field effect in a PbS/PbTiO3/Si heterostructure
Published: AUG 25 1997, APPLIED PHYSICS LETTERS, 71, 1106, DOI: 10.1063/1.119740
849. Enhancement of the photoconductive properties of PbS films deposited on ferroelectric substrates
Published: FEB 1997, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 44, 296, DOI: 10.1016/S0921-5107(96)01729-1
850. Equivalent circuit analysis of a PbS/ferroelectric heterostructure
Published: FEB 1997, INFRARED PHYSICS & TECHNOLOGY, 38, 58, DOI: 10.1016/S1350-4495(96)00026-6
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