National Institute Of Materials Physics - Romania

The electrical properties measurements station is designated for characterization at varying temperatures and magnetic fields of semiconductor devices and thin layers of functional and multifunctional materials in a clean room regime. TECHNICAL SPECIFICATIONS 4 XYZ manipulator arms with standardized connection point type elastic metal pin for contacting samples with varying sizes in plan, from 3 […]

Technical details:  Optical microscope AMPLIVAL POL-U (Zeiss Jena); Heating stage (Instec); Video camera (color or black-and-white) Applications: Observing optical anisotropy; Current observations on alignment/orientation; Ordering in the surface layer of different mesophases

Useful instrument to study the unresolved hyperfine interactions (static or dynamic –magnetic, electric interactions in solid samples), owing to the possibility to apply a stationary magnetic field up to 6T at ultra –low temperatures. The system consists in two main parts: – ICEoxford (England) cryogenic low temperature superconducting magnet system for Mössbauer measurements, – WissEL […]