National Institute Of Materials Physics - Romania
Optical Processes in Nanostructured Materials
Facilities and Services
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ViewTechnical details: – radiation source: introduction of radiation from a 780 nm LED in an integrative sphere ensures an intense and homogeneous radiation in space; – measuring places: flow cell with two channels, illuminated area 4.5 mm2; – detection: with extreme sensitivity sensor, two strings of diodes 1024 pixels; – resolution of the refractive angle: […]
ViewTechnical details:– Michaelson interferometer; 57 mm dynamically aligned, 60° air bearing Michelson – KBr beamsplitter; – Optical microscope for infrared range Cary 610: Collection objective: 15x IR/Visible all-reflecting on-axis Schwarzchild objective; NA = 0.62, working distance = 21 mm; Includes slide-on Ge micro ATR (Provides 1.1 um pixel size) – detector: Wideband MCT 100 μm […]
ViewTechnical details: – Power supply: 100-240Vac – 50-60 Hz – KVA – Scanning performances: acquisition times ³ 100 ms – Auxiliary voltage (compliance): ± 20 V – Maximum current: ± 500 mA/± 1A/±5A -Applied voltage: ±15V -Current measurement: -9 ranges from 5 nA to 500 mA for OGF500 – 9 ranges from 10 nA to […]
ViewTechnical details:Voltammetry Maximum compliance voltage ± 30 V Maximum current output ± 1A Maximum polarisation voltage ± 15 V Scan rate 0.01- 20 V s-1 Best current resolution: 0.3 pA Electrochemical Impedance Max. Frequency 100 KHz Min. Frequency 1 mHz Software VoltaMaster4 Services offered to users: studies by cyclic voltammetry, electrochemical impedance spectroscopy, corrosion (polarization […]
ViewTechnical details:-excitation source: 450 W Xe lamp-monochromators (excitation emission): f/3.6 Czeny-Turner, double grating, all reflectiveoptics-diffraction gratings: classically ruled, 1200 tr/mm; blaze 330 nm (MEx) and 500 nm(MEm)-emission signal detector: at room tempe-rature-R928P side-on photomultiplier tube(180-850nm);-software package: FluorEssence 2.0 (powered by Origin 7.5) Performances:-excitation range: 240-600 nm-emission range: 290-850 nm-photomultiplier response linearity: 2×106 cps (in photon […]
ViewTechnical details:-excitation sources: tungsten and deuterium lamps-double monochromator equipped with 1140 tr/mm (UV/VIS range) and 360 tr/mm (NIR range) gratings-detectors: R6872 (UV/VIS range) and PbS-Peltier effect cooled (NIR range) photomultipliers-beam splitter: 46 Hz chopper-Acquisition & control software: UV WinLab 5.2.0-accessories: integrating sphere and universal reflectance accessoryPerformances:-spectral range: 175-3300 nm-resolution: δ 0.05nm (UV/VIS), δ 0.2 nm (NIR)-wavelength precision: […]
ViewTechnical details:-KBr beamsplitter & RT-DLaTGS detector (mid-infrared)-T222/3 multilayer beamsplitter & RT-DTGS-FIR detector– Michaelson interferometer: ROCKSOLID configuration, permanently aligned;-alignment excitation source: HeNe laser, 633 nm, 1mW-Acquisition & control software: OPUS 6.0– accessories: ATR devicePerformances:-standard spectral range: 370-7500 cm-1-far IR extension: 50-680 cm-1-resolution: 2 cm-1 Services offered to users: analysis by IR spectroscopy in the geometry of […]
ViewTechnical details:– the T64000 Raman system is composed of a pre-monochromator and a spectrograph stage; – the pre-monochromator, working as a tunable filter is a double subtractive monochromator equipped with two 1800 gr/mm diffraction gratings.– the spectrograph stage, used as disperser is provided with a two grating-turret (one of the two gratings of 1800gr/mm and the other […]
ViewTechnical details:-excitation source: YAG:Nd laser ( 1064 nm) 500mW, horizontally polarized (H)-Michaelson interferometer: ROCKSOLID configuration, permanently aligned-alignment excitation source: HeNe laser, 633 nm, 1mW-Excitation radiation rejection: NOCH filter-Detector: Ge-diode, cooled at liquid nitrogen temperature (77K)-Acquisition &Control software: OPUS 8.5Performances:-spectral domain: 50-3600 cm-1 (Stokes shift), -resolution: 1 cm-1Experiment types:FT-Raman180o (back scattering) and 90o (right angle) measuring geometriesFT-Raman Microscope180o (back scattering) […]
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