National Institute Of Materials Physics - Romania

Automatic liquid helium plant model LHeP18 from Cryomech Operating parameters: Operation without precooling with liquid nitrogen; Liquid nitrogen cooled He purifier; 18 l of liquid helium per 24 h; Medium pressure Helium recovery system from Cryomech Technical information: Helium recovery compressor: 400 psig (27.6 bar); Recovery bag volume: 8.5 m3; 8 storage cylinders: 12.3 m3 […]

UV-VIS double beam spectrophotometer, model Specord 250 Plus, Analytik Jena Operating parameters: Spectral range: 190 – 1100 nm; Wavelength accuracy: ± 0.1 nm; Variable spectral bandwidth: 0.5 nm, 1 nm, 2 nm, 4 nm; Acquisition & control software: WinAspect; Diffuse reflectance accessory with integrating sphere.   Available experiments: Absorbance, Transmittance, Energy, Reflectance; Spectral scan; Time […]

Compact EPR Spectrometer CMS 8400 from ADANI Systems Operating parameters: Compact: Portable, full computer control; Frequency: 9.2 – 9.5 GHz; Sensitivity: 1011 spins/Gauss; Field range: 0.05 – 0.6 T; Solid and liquid samples.

Available instruments: diamond wire saw (MTI), ultrasound disc cutter (Gatan), dimple grinder (Gatan), lapping machines (MTI), ion milling (Gatan PIPS), reversed metallographic microscope (Zeiss Axio Observer), stereoscopic optical microscope (Zeiss Stemi 2000), vacuum evaporators (JEOL).  

FT/CW X-band EPR spectrometer model ELEXSYS E580 from Bruker with pulse ENDOR (E560 DICE II) and ELDOR (E580-400) accessories Operating parameters:  Frequency range (CW mode): 9.2- 9.9 GHz; Sensitivity (CW mode): 1.2 x 109 spins/Gauss; Magnetic field: 0.03 – 1.45 T; RF range and power (for ENDOR measurements): 100 kHz – 250 MHz; 150W Pulse […]

A multifunctional instrument, provided with imaging (FEG-SEM), ion-beam processing (FIB), analytical (EDS) and electron diffraction (EBSD) capabilities for advanced characterization of microscopic morphology, elemental composition, chemical mapping and surface structural mapping. Configuration: FEG-SEM (Schottky gun), FIB (Orsay Physics), EDS (Bruker Quantax 200), EBSD (Bruker e-Flash 1000) Technical specifications: SEM acceleration voltages 0.2-30 kV; SE and […]

A multifunctional tool, designed for the research and characterization of advanced materials, used for the following types of studies: conventional TEM, HRTEM, STEM, electron tomography, precession electron diffraction (PED), in-situ TEM at high or cryogenic temperatures, energy dispersive X-ray spectroscopy, elemental chemical mapping. Configuration: LaB6 gun, STEM unit, JEOL JED-2300T Dry SDD EDS unit, emSIS […]

CW Q-band EPR spectrometer model ELEXSYS E500 from Bruker with E560 ENDOR accessory Operating parameters: Frequency: 34 GHz; Sensitivity: 109 spins/Gauss; Magnetic field: 0.03 – 1.8 T; Effective RF range: 1 – 250 MHz; Temperature: 5 – 300 K; Available CW EPR experiments: Q-band EPR; Electron-Nuclear Double Resonance (ENDOR); ENDOR induced EPR (EIE); TRIPLE resonance.

Aberration corrected analytical instrument designed for atomic resolution characterization of advanced materials by imaging (HRTEM, STEM) and spectroscopic (EELS, EDS) methods. Configuration: Schottky Field Emission Gun (FEG), CEOS spherical aberration corrector for STEM mode, STEM Unit, Gatan Quantum SE EELS and Image Filter, JEOL JED-2300T EDS unit, Gatan Orius 200D CCD (wide angle port), Gatan […]

Electrical characterization in dark and under illumination and Hall investigations by measurements and modelling of experimental curves: current-voltage (I– V) at different temperatures T, in DC and AC regime capacitance-voltage (C– V), capacitance-frequency (C – f) and capacitance-time (C – t) polarization-voltage (P– V) I– T and R – T at different bias voltages Photocurrent spectra (I– λ) under modulated and continuous light regime Hall measurements: V–Icharacteristics for different applied currents, […]