National Institute Of Materials Physics - Romania
Publications
4291. Monte Carlo simulation study of magnetic behaviour of core-shell bimetallic nanoparticles
Published: 2004, SECOND SEEHEIM CONFERENCE ON MAGNETISM, PROCEEDINGS, 3763, DOI: 10.1002/pssc.200405549
4292. Radiation hardness of silicon - a challenge for defect engineering
Published: DEC 31 2003, PHYSICA B-CONDENSED MATTER, 340, 709, DOI: 10.1016/j.physb.2003.09.238
4293. Second-order generation of point defects in highly irradiated float zone silicon - annealing studies
Published: DEC 31 2003, PHYSICA B-CONDENSED MATTER, 340, 582, DOI: 10.1016/j.physb.2003.09.131
4294. Electronic transport in nanosystems
Published: DEC 15 2003, MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, 23, 681, DOI: 10.1016/j.msec.2003.09.080
4295. Fabrication of novel magnetic nanostructures by colloidal bimetallic nanocrystals and multilayers
Published: DEC 15 2003, MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, 23, 878, DOI: 10.1016/j.msec.2003.09.147
4296. Superior radiation tolerance of thin epitaxial silicon detectors
Published: DEC 11 2003, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 515, 670, DOI: 10.1016/j.nima.2003.07.021
4297. Influence of the reaction conditions on the activity properties of vanadium-aluminium oxynitride propane ammoxidation catalyst
Published: DEC 8 2003, , DOI: 10.1016/S0926-860X(03)00591-X
4298. A study of the SnO2 and CuSb2O6 based solid solutions: Electrical and magnetic properties
Published: DEC 2003, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 5, 1002, DOI:
4299. Control of the growth mechanism of (119) Bi-2223 superconducting thin films. Two-dimensional nucleation growth and step-flow growth
Published: DEC 2003, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 5, 1028, DOI:
4300. Field effect assisted thermally stimulated currents in CdS thin films deposited on SiO2/Si substrates
Published: DEC 2003, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 5, 852, DOI:
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