National Institute Of Materials Physics - Romania

Publications

articles found
4411. Synthesis, characterization and thermal decomposition studies of some malates coordination compounds - part I. Iron-nickel compounds
Authors: Carp, O; Patron, L; Mindru, I; Marinescu, G; Diamandescu, L; Banuta, A

Published: 2003, JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY, 74, 799, DOI: 10.1023/B:JTAN.0000011011.48105.34

4412. Compact filters with cross-coupled resonators
Authors: Banciu, MG; Lojewski, G; Ioachim, A

Published: 2003, 2003 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 116, DOI: 10.1109/SMICND.2003.1251357

4413. Coherent leakage current in mesoscopic MIS-type capacitors
Authors: Racec, PN; Racec, ER; Nemnes, GA; Wulf, U

Published: FEB-JUN 2003, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 6, 135, DOI: 10.1016/S1369-8001(03)00079-9

4414. Eu-doped PT-type ceramics. I. Preparation and structural investigation
Authors: Dimitriu, E; Ion, ED; Constantinescu, S; Bunescu, M; Ramer, R

Published: 2003, FERROELECTRICS, 294, 92, DOI: 10.1080/00150190390238658

4415. Self-organization in non-crystalline solids
Authors: Popescu, M

Published: 2003, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 5, 1068, DOI:

4416. Pulsed laser deposition of selenium-sulfur doped by paraffins
Authors: Lorinczi, A

Published: 2003, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 5, 1084, DOI:

4417. A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films
Authors: Nistor, L; Richard, O; Zhao, C; Bender, H; Stesmans, A; Van Tendeloo, G

Published: 2003, MICROSCOPY OF SEMICONDUCTING MATERIALS 2003, 400, DOI:

4418. Frequency agile BST materials for microwave applications
Authors: Ioachim, A; Toacsan, MI; Banciu, MG; Nedelcu, L; Plapcianu, C; Alexandru, H; Berbecaru, C; Ghetu, D; Stoica, G; Ramer, R

Published: 2003, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 5, 1393, DOI:

4419. Thermal effects at the interaction of SnO2 chemoresistive sensors with reducing gases
Authors: Tomescu, A; Roescu, R; Ionescu, R

Published: 2003, Sensors for Environmental Control, 108, DOI:

4420. Formation of the Z(1,2) deep-level defects in 4H-SiC epitaxial layers: Evidence for nitrogen participation
Authors: Pintilie, I; Pintilie, L; Irmscher, K; Thomas, B

Published: DEC 16 2002, APPLIED PHYSICS LETTERS, 81, 4843, DOI: 10.1063/1.1529314



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