National Institute Of Materials Physics - Romania
Publications
4591. Nanoscale science and engineering in Romania
Published: DEC 2001, JOURNAL OF NANOPARTICLE RESEARCH, 3, 352, DOI: 10.1023/A:1012555023738
4592. Non-Heisenberg magnetic behavior of a triangular bridged heterometallic Fe-2(III)Co(II) complex: Evidence of strong orbital contributions
Published: NOV 22 2001, JOURNAL OF CHEMICAL PHYSICS, 115, 9535, DOI: 10.1063/1.1413988
4593. Comment on "Coulomb-gas scaling law for superconducting Bi2+ySr2-x-yLaxCuO6+delta thin films in magnetic fields
Published: NOV 12 2001, PHYSICAL REVIEW LETTERS, 87, DOI: 10.1103/PhysRevLett.87.209703
4594. Luminescence of oxidized porous silicon: Surface-induced emissions from disordered silica micro- to nanotextures
Published: NOV 1 2001, JOURNAL OF APPLIED PHYSICS, 90, 4782, DOI: 10.1063/1.1410887
4595. Magnetization relaxation in the flux-creep annealing regime across the second magnetization peak of disordered YBa2Cu3O7-x crystals
Published: OCT 15 2001, PHYSICA C, 363, 54, DOI: 10.1016/S0921-4534(01)00621-9
4596. Transmission electron microscopy study of silicon nitride amorphous films obtained by reactive pulsed laser deposition
Published: OCT 1 2001, THIN SOLID FILMS, 397, 16, DOI: 10.1016/S0040-6090(01)01408-0
4597. Influence of LiF addition on the superconducting properties of Bi1.7Pb0.4Sr1.5Ca2.5Cu3.6Ox high-temperature superconducting oxide
Published: OCT 2001, JOURNAL OF SUPERCONDUCTIVITY, 14, 579, DOI: 10.1023/A:1012983831008
4598. Preparation and characterization of Ce-doped BaTiO3 thin films by r.f. sputtering
Published: OCT 2001, JOURNAL OF MATERIALS SCIENCE, 36, 5030, DOI: 10.1023/A:1011858319581
4599. Annealing of radiation-induced defects in silicon in a simplified phenomenological model
Published: OCT 2001, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 183, 390, DOI: 10.1016/S0168-583X(01)00767-4
4600. Enhanced magnetization at integer quantum Hall states
Published: SEP 15 2001, PHYSICAL REVIEW B, 64, DOI: 10.1103/PhysRevB.64.121306
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