National Institute Of Materials Physics - Romania

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articles found
4611. In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines
Authors: Teodorescu, V; Nistor, L; Bender, H; Steegen, A; Lauwers, A; Maex, K; Van Landuyt, J

Published: JUL 1 2001, JOURNAL OF APPLIED PHYSICS, 90, 174, DOI: 10.1063/1.1378812

4612. Radiation hard silicon detectors - developments by the RD48 (ROSE) collaboration
Authors: Lindstrom, G; Ahmed, M; Albergo, S; Allport, P; Anderson, D; Andricek, L; Angarano, MM; Augelli, V; Bacchetta, N; Bartalini, P; Bates, R; Biggeri, U; Bilei, GM; Bisello, D; Boemi, D; Borchi, E; Botila, T; Brodbeck, TJ; Bruzzi, M; Budzynski, T; Burger, P; Campabadal, F; Casse, G; Catacchini, E; Chilingarov, A; Ciampolini, P; Cindro, V; Costa, MJ; Creanza, D; Clauws, P; Da Via, C; Davies, G; De Boer, W; Dell'Orso, R; De Palma, M; Dezillie, B; Eremin, V; Evrard, O; Fallica, G; Fanourakis, G; Feick, H; Focardi, E; Fonseca, L; Fretwurst, E; Fuster, J; Gabathuler, K; Glaser, M; Grabiec, P; Grigoriev, E; Hall, G; Hanlon, M; Hauler, F; Heising, S; Holmes-Siedle, A; Horisberger, R; Hughes, G; Huhtinen, M; Ilyashenko, I; Ivanov, A; Jones, BK; Jungermann, L; Kaminsky, A; Kohout, Z; Kramberger, G; Kuhnke, M; Kwan, S; Lemeilleur, F; Leroy, C; Letheren, M; Li, Z; Ligonzo, T; Linhart, V; Litovchenko, P; Loukas, D; Lozano, M; Luczynski, Z; Lutz, G; MacEvoy, B; Manolopoulos, S; Markou, A; Martinez, C; Messineo, A; Mikuz, M; Moll, M; Nossarzewska, E; Ottaviani, G; Oshea, V; Parrini, G; Passeri, D; Petre, D; Pickford, A; Pintilie, I; Pintilie, L; Pospisil, S; Potenza, R; Raine, C; Rafi, JM; Ratoff, PN; Richter, RH; Riedler, P; Roe, S; Roy, P; Ruzin, A; Ryazanov, AI; Santocchia, A; Schiavulli, L; Sicho, P; Siotis, I; Sloan, T; Slysz, W; Smith, K; Solanky, M; Sopko, B; Stolze, K; Avset, BS; Svensson, B; Tivarus, C; Tonelli, G; Tricomi, A; Tzamarias, S; Valvo, G; Vasilescu, A; Vayaki, A; Verbitskaya, E; Verdini, P; Vrba, V; Watts, S; Weber, ER; Wegrzecki, M; Wegrzecka, I; Weilhammer, P; Wheadon, R; Wilburn, C; Wilhelm, I; Wunstorf, R; Wustenfeld, J; Wyss, J; Zankel, K; Zabierowski, P; Zontar, D

Published: JUL 1 2001, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 466, 326, DOI: 10.1016/S0168-9002(01)00560-5

4613. X-ray diffraction, transmission Mossbauer spectrometry and conversion electron Mossbauer spectroscopy studies of the Fe87Zr6B6Cu1 nanocrystallization process
Authors: Bibicu, I; Garitaonandia, JS; Plazaola, F; Apinaniz, E

Published: JUL 2001, JOURNAL OF NON-CRYSTALLINE SOLIDS, 287, 281, DOI: 10.1016/S0022-3093(01)00589-0

4614. Tunneling spectroscopy in Fe-GaN-Fe trilayer structures grown by MBE using ECR microwave plasma nitrogen source
Authors: Nemeth, S; Boeve, H; Liu, ZY; Attenborough, K; Bender, H; Nistor, L; Borghs, G; De Boeck, J

Published: JUL 2001, JOURNAL OF CRYSTAL GROWTH, 227, 892, DOI: 10.1016/S0022-0248(01)00923-X

4615. Some superconducting properties of the inter-domain border of melt-textured YBa2Cu3O7-delta
Authors: Crisan, A; Gordeev, SN; de Groot, PAJ; Beduz, C

Published: JUN 15 2001, PHYSICA C, 355, 237, DOI: 10.1016/S0921-4534(01)00023-5

4616. Classical polarons in a constant electric field
Authors: Meinert, G; Banyai, L; Gartner, P

Published: JUN 15 2001, PHYSICAL REVIEW B, 63, DOI: 10.1103/PhysRevB.63.245203

4617. Developments for radiation hard silicon detectors by defect engineering - results by the CERN RD48 (ROSE) Collaboration
Authors: Lindstrom, G; Ahmed, M; Albergo, S; Allport, P; Anderson, D; Andricek, L; Angarano, MM; Augelli, V; Bacchetta, N; Bartalini, P; Bates, R; Biggeri, U; Bilei, GM; Bisello, D; Boemi, D; Borchi, E; Botila, T; Brodbeck, TJ; Bruzzi, M; Budzynski, T; Burger, P; Campabadal, F; Casse, G; Catacchini, E; Chilingarov, A; Ciampolini, P; Cindro, V; Costa, MJ; Creanza, D; Clauws, P; Da Via, C; Davies, G; De Boer, W; Dell'Orso, R; De Palma, M; Dezillie, B; Eremin, V; Evrard, O; Fallica, G; Fanourakis, G; Feick, H; Focardi, E; Fonseca, L; Fretwurst, E; Fuster, J; Gabathuler, K; Glaser, M; Grabiec, P; Grigoriev, E; Hall, G; Hanlon, M; Hauler, F; Heising, S; Holmes-Siedle, A; Horisberger, R; Hughes, G; Huhtinen, M; Ilyashenko, I; Ivanov, A; Jones, BK; Jungermann, L; Kaminsky, A; Kohout, Z; Kramberger, G; Kuhnke, M; Kwan, S; Lemeilleur, F; Leroy, C; Letheren, M; Li, Z; Ligonzo, T; Linhart, V; Litovchenko, P; Loukas, D; Lozano, M; Luczynski, Z; Lutz, G; MacEvoy, B; Manolopoulos, S; Markou, A; Martinez, C; Messineo, A; Mikuz, M; Moll, M; Nossarzewska, E; Ottaviani, G; Oshea, V; Parrini, G; Passeri, D; Petre, D; Pickford, A; Pintilie, I; Pintilie, L; Pospisil, S; Potenza, R; Radicci, V; Raine, C; Rafi, JM; Ratoff, PN; Richter, RH; Riedler, P; Roe, S; Roy, P; Ruzin, A; Ryazanov, AI; Santocchia, A; Schiavulli, L; Sicho, P; Siotis, I; Sloan, T; Slysz, W; Smith, K; Solanky, M; Sopko, B; Stolze, K; Avset, BS; Svensson, B; Tivarus, C; Tonelli, G; Tricomi, A; Tzamarias, S; Valvo, G; Vasilescu, A; Vayaki, A; Verbitskaya, E; Verdini, P; Vrba, V; Watts, S; Weber, ER; Wegrzecki, M; Wegrzecka, I; Weilhammer, P; Wheadon, R; Wilburn, C; Wilhelm, I; Wunstorf, R; Wustenfeld, J; Wyss, J; Zankel, K; Zabierowski, P; Zontar, D

Published: JUN 1 2001, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 465, 69, DOI: 10.1016/S0168-9002(01)00347-3

4618. Fluctuation magnetoconductivity of BSCCO-2212 films in parallel magnetic field
Authors: Balestrino, G; Crisan, A; Livanov, DV; Manokhin, SI; Milani, E

Published: JUN 1 2001, PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 355, 139, DOI: 10.1016/S0921-4534(00)01771-8

4619. Selective polypyrrole electrodes for quartz microbalances: NO2 and gas flux sensitivities
Authors: Henkel, K; Oprea, A; Paloumpa, I; Appel, G; Schmeisser, D; Kamieth, P

Published: JUN 1 2001, SENSORS AND ACTUATORS B-CHEMICAL, 76, 129, DOI: 10.1016/S0925-4005(01)00600-1

4620. Chemically prepared nanocrystalline PbS thin films
Authors: Pentia, E; Pintilie, L; Matei, I; Botila, T; Ozbay, E

Published: JUN 2001, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 3, 530, DOI:



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