National Institute Of Materials Physics - Romania
Publications
4661. Filamentary iron nanostructures from laser-induced pyrolysis of iron pentacarbonyl and ethylene mixtures
Published: JAN 2001, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 72, 11, DOI: 10.1007/s003390000599
4662. Symmetry and hyperfine magnetic fields in Nd-based intermetallics
Published: JAN 2001, INTERMETALLICS, 9, 71, DOI: 10.1016/S0966-9795(00)00099-6
4663. Neutron diffraction direct observation of the decomposition processes in a Bi : Pb : Sr : Ca : Cu=1.7 : 0.3 : 2.0 : 2.5 : 3.5 nitrate freeze dried powder
Published: 2001, EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 378-3, 345, DOI: 10.4028/www.scientific.net/MSF.378-381.340
4664. Chemical composition of structures obtained inside quartz crystals by sodium electrodiffusion
Published: 2001, CRYSTAL RESEARCH AND TECHNOLOGY, 36, 410, DOI: 10.1002/1521-4079(200106)36:4/5<403::AID-CRAT403>3.0.CO;2-H
4665. Mechanical and electromechanical nonlinearities of a piezoelectric trimorph type actuator
Published: 2001, CAS: 2002 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 74, DOI:
4666. HREM investigation of a Fe/GaN/Fe tunnel junction
Published: 2001, MICROSCOPY OF SEMICONDUCTING MATERIALS 2001, 56, DOI:
4667. Mass-loading effect on parameters of quartz and langasite resonators: Recent results
Published: JAN-FEB 2001, ANNALES DE CHIMIE-SCIENCE DES MATERIAUX, 26, 171, DOI: 10.1016/S0151-9107(01)90031-5
4668. A 95 GHz ODMR study of AgCl nanocrystals embedded in crystalline KCl matrix
Published: 2001, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 156, 144, DOI: 10.1080/10420150108216885
4669. X-ray topography studies on the influence of the mass-loading effect on resonator parameters
Published: 2001, PROCEEDINGS OF THE 2001 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM & PDA EXHIBITION, 615, DOI: 10.1109/FREQ.2001.956349
4670. PbSe1-xTex thick thermoelectric films obtained by electrochemical deposition from aqueous solutions
Published: 2001, TWENTIETH INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS, 330, DOI: 10.1109/ICT.2001.979898
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