National Institute Of Materials Physics - Romania

Publications

articles found
4731. Microparacrystalline model for medium range order in covalent glasses
Authors: Bradaczek, H; Popescu, M

Published: JUN 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 158, DOI:

4732. Trapping levels in nanocrystalline porous silicon
Authors: Ciurea, ML; Draghici, M; Lazanu, S; Iancu, V; Nassiopoulou, A; Ioannou, V; Tsakiri, V

Published: MAY 22 2000, APPLIED PHYSICS LETTERS, 76, 3069, DOI: 10.1063/1.126581

4733. Electrical and photovoltaic properties of photosensitised ITO/a-Si : H p-i-n/TPyP/Au cells
Authors: Antohe, S; Ion, L; Tomozeiu, N; Stoica, T; Barna, E

Published: MAY 15 2000, SOLAR ENERGY MATERIALS AND SOLAR CELLS, 62, 216, DOI: 10.1016/S0927-0248(99)00127-0

4734. Size distribution and electroluminescence of self-assembled Ge dots
Authors: Vescan, L; Stoica, T; Chretien, O; Goryll, M; Mateeva, E; Muck, A

Published: MAY 15 2000, JOURNAL OF APPLIED PHYSICS, 87, 7282, DOI: 10.1063/1.372980

4735. Symmetry and hyperfine fields in R2Fe17-xVxCy (R=Y, Gd; x=1, 1.5, 2 and y=0,1) intermetallics
Authors: Sorescu, M; Valeanu, M

Published: MAY 1 2000, JOURNAL OF APPLIED PHYSICS, 87, 6727, DOI: 10.1063/1.372821

4736. Electron-hole recombination in PbCl2 : T1 crystals
Authors: Nistor, SV; Stefan, M; Goovaerts, E; Schoemaker, D

Published: MAY 2000, JOURNAL OF LUMINESCENCE, 87-9, 551, DOI: 10.1016/S0022-2313(99)00287-2

4737. Integration of quantum transport models in classical device simulators
Authors: Racec, PN; Wulf, U; Kucera, J

Published: MAY 2000, SOLID-STATE ELECTRONICS, 44, 886, DOI: 10.1016/S0038-1101(99)00288-9

4738. Polymeric electrodes
Authors: Appel, G; Mikalo, R; Henkel, K; Oprea, A; Yfantis, A; Paloumpa, I; Schmeisser, D

Published: MAY 2000, SOLID-STATE ELECTRONICS, 44, 861, DOI: 10.1016/S0038-1101(99)00282-8

4739. Dielectric measurements of liquid crystals confined to molecular sieves
Authors: Frunza, S; Frunza, L; Schonhals, A

Published: MAY 2000, JOURNAL DE PHYSIQUE IV, 10, 118, DOI: 10.1051/jp4:2000723

4740. Field effect enhanced signal-to-noise ratio in chemically deposited PbS thin films on Si3N4/n-Si substrates
Authors: Pintilie, L; Pentia, E; Pintilie, I; Botila, T

Published: APR 3 2000, APPLIED PHYSICS LETTERS, 76, 1892, DOI: 10.1063/1.126202



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