National Institute Of Materials Physics - Romania
Publications
4731. Microparacrystalline model for medium range order in covalent glasses
Published: JUN 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 158, DOI:
4732. Trapping levels in nanocrystalline porous silicon
Published: MAY 22 2000, APPLIED PHYSICS LETTERS, 76, 3069, DOI: 10.1063/1.126581
4733. Electrical and photovoltaic properties of photosensitised ITO/a-Si : H p-i-n/TPyP/Au cells
Published: MAY 15 2000, SOLAR ENERGY MATERIALS AND SOLAR CELLS, 62, 216, DOI: 10.1016/S0927-0248(99)00127-0
4734. Size distribution and electroluminescence of self-assembled Ge dots
Published: MAY 15 2000, JOURNAL OF APPLIED PHYSICS, 87, 7282, DOI: 10.1063/1.372980
4735. Symmetry and hyperfine fields in R2Fe17-xVxCy (R=Y, Gd; x=1, 1.5, 2 and y=0,1) intermetallics
Published: MAY 1 2000, JOURNAL OF APPLIED PHYSICS, 87, 6727, DOI: 10.1063/1.372821
4736. Electron-hole recombination in PbCl2 : T1 crystals
Published: MAY 2000, JOURNAL OF LUMINESCENCE, 87-9, 551, DOI: 10.1016/S0022-2313(99)00287-2
4737. Integration of quantum transport models in classical device simulators
Published: MAY 2000, SOLID-STATE ELECTRONICS, 44, 886, DOI: 10.1016/S0038-1101(99)00288-9
4738. Polymeric electrodes
Published: MAY 2000, SOLID-STATE ELECTRONICS, 44, 861, DOI: 10.1016/S0038-1101(99)00282-8
4739. Dielectric measurements of liquid crystals confined to molecular sieves
Published: MAY 2000, JOURNAL DE PHYSIQUE IV, 10, 118, DOI: 10.1051/jp4:2000723
4740. Field effect enhanced signal-to-noise ratio in chemically deposited PbS thin films on Si3N4/n-Si substrates
Published: APR 3 2000, APPLIED PHYSICS LETTERS, 76, 1892, DOI: 10.1063/1.126202
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