National Institute Of Materials Physics - Romania
Publications
4741. Condensation kinetics for bosonic excitons interacting with a thermal phonon bath
Published: APR 1 2000, PHYSICAL REVIEW B, 61, 8834, DOI: 10.1103/PhysRevB.61.8823
4742. Conduction mechanisms in some icosahedral and amorphous phases
Published: APR 2000, PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 218, 494, DOI: 10.1002/1521-3951(200004)218:2<485::AID-PSSB485>3.0.CO;2-6
4743. Synthesis of the Ca0.45Cu0.55O peritectic phase using a mixture of nitrate powders
Published: APR 2000, MATERIALS LETTERS, 43, 184, DOI: 10.1016/S0167-577X(99)00256-6
4744. Physical properties of skutterudites YbxM4Sb12, M = Fe, Co, Rh, Ir
Published: APR 2000, EUROPEAN PHYSICAL JOURNAL B, 14, 493, DOI: 10.1007/s100510051057
4745. Studies concerning secondary synthesis processes in [Bi(Pb)](2)[Sr(Ba)](2)Ca(2)Cu(3)Oy freeze dried superconducting ceramic
Published: APR 2000, JOURNAL OF MATERIALS SCIENCE LETTERS, 19, 563, DOI: 10.1023/A:1006765825483
4746. Hysteresis effect due to the exchange Coulomb interaction in short-period superlattices in tilted magnetic fields
Published: MAR 15 2000, PHYSICAL REVIEW B, 61, R7860, DOI: 10.1103/PhysRevB.61.R7858
4747. Structural and magnetic investigation of nonstoichiometric YFe10V2 and its interstitial carbide prepared by arc-melting
Published: MAR 14 2000, JOURNAL OF ALLOYS AND COMPOUNDS, 299, 54, DOI: 10.1016/S0925-8388(99)00791-4
4748. Structural investigation of a La0.6Y0.07Ca0.33MnO3 thin film by high resolution transmission electron microscopy
Published: MAR 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 72, DOI:
4749. Characterization of carbon nitride films deposited by hollow cathode discharge process
Published: MAR 2000, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 161, 1006, DOI: 10.1016/S0168-583X(99)00957-X
4750. Synthesis and characterization of carbon nitride thin films obtained by laser induced chemical vapour deposition
Published: MAR 2000, SURFACE & COATINGS TECHNOLOGY, 125, 307, DOI: 10.1016/S0257-8972(99)00577-0
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