National Institute Of Materials Physics - Romania
Publications
4741. Mass-loading effect on parameters of quartz and langasite resonators: Recent results
Published: JAN-FEB 2001, ANNALES DE CHIMIE-SCIENCE DES MATERIAUX, 26, 171, DOI: 10.1016/S0151-9107(01)90031-5
4742. A 95 GHz ODMR study of AgCl nanocrystals embedded in crystalline KCl matrix
Published: 2001, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 156, 144, DOI: 10.1080/10420150108216885
4743. X-ray topography studies on the influence of the mass-loading effect on resonator parameters
Published: 2001, PROCEEDINGS OF THE 2001 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM & PDA EXHIBITION, 615, DOI: 10.1109/FREQ.2001.956349
4744. PbSe1-xTex thick thermoelectric films obtained by electrochemical deposition from aqueous solutions
Published: 2001, TWENTIETH INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS, 330, DOI: 10.1109/ICT.2001.979898
4745. Aspects in HTS laser ablation thin film technology and characterization
Published: 2001, 11TH INTERNATIONAL SCHOOL ON QUANTUM ELECTRONICS: LASER PHYSICS AND APPLICATIONS, 4397, 313, DOI: 10.1117/12.425154
4746. Fourth-order zero-field splitting parameters of [Mn(cyclam)Br-2]Br determined by single-crystal W-band EPR
Published: 2001, APPLIED MAGNETIC RESONANCE, 21, 596, DOI: 10.1007/BF03162431
4747. Influence of gamma irradiation on the thermal stability of blends of PP with previously treated sisal fiber
Published: 2001, POLYMER DEGRADATION AND STABILITY, 73, 236, DOI: 10.1016/S0141-3910(01)00036-2
4748. The influence of the h-BN morphology and structure on the c-BN growth
Published: MAR-JUL 2001, DIAMOND AND RELATED MATERIALS, 10, 1356, DOI: 10.1016/S0925-9635(00)00377-0
4749. Point defects in cubic boron nitride crystals
Published: MAR-JUL 2001, DIAMOND AND RELATED MATERIALS, 10, 1411, DOI: 10.1016/S0925-9635(00)00396-4
4750. Bi2-xSbxTe3 thick thermoelectric films obtained by electrodeposition from hydrochloric acid solutions.
Published: 2001, TWENTIETH INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS, 326, DOI: 10.1109/ICT.2001.979897
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