National Institute Of Materials Physics - Romania
Publications
4781. A device for critical current measurement in high-Tc ceramic superconductors
Published: 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 715, DOI:
4782. Paracrystallinity
Published: 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 656, DOI:
4783. Non-isothermal pyrolysation of the spray-frozen freeze dried complex nitrate in Bi(Pb)-Sr(Ba)-Ca-Cu system investigated by X-ray diffraction analysis
Published: 2000, EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 321-3, 839, DOI: 10.4028/www.scientific.net/MSF.321-324.834
4784. The influence of interface on the spontaneous polarisation in PbTiO3 thin films deposited on a silicon substrate
Published: 2000, PIEZOELECTRIC MATERIALS: ADVANCES IN SCIENCE, TECHNOLOGY AND APPLICATIONS, 76, 308, DOI:
4785. Characterisation of anodic oxide for GaAs based laser diodes
Published: 2000, ROMOPTO 2000: SIXTH CONFERENCE ON OPTICS, 4430, 740, DOI:
4786. The perturbative floquet solution for quasi-free electrons
Published: AUG-SEP 2000, PHYSICA SCRIPTA, 62, 105, DOI: 10.1238/Physica.Regular.062a00097
4787. EPR observation of first point defects in cubic boron nitride crystalline powders
Published: 2000, SOLID STATE COMMUNICATIONS, 115, 44, DOI: 10.1016/S0038-1098(00)00135-6
4788. Crystal and molecular structure of complex compound [Fe3O(CH3COO)(6)(H2O)(3)](2)[ZnCl4]center dot 2H(2)O
Published: MAY-JUN 2000, CRYSTALLOGRAPHY REPORTS, 45, 421, DOI:
4789. The ferroelectric phase transition in tridymite type BaAl2O4 studied by electron microscopy
Published: 2000, PHASE TRANSITIONS, 71, 160, DOI: 10.1080/01411590008224545
4790. Electrical properties of nanocrystalline porous silicon
Published: 2000, 2000 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, CAS 2000 PROCEEDINGS, 64, DOI: 10.1109/SMICND.2000.890188
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