National Institute Of Materials Physics - Romania

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articles found
5021. Electron and hole trapping in PbCl2 and PbCl2 : Tl crystals
Authors: Nistor, SV; Goovaerts, E; Stefan, M; Schoemaker, D

Published: MAY 1998, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 141, 541, DOI: 10.1016/S0168-583X(98)00051-2

5022. Energy-band structure of spin-Peierls crystal CuGeO3
Authors: Syrbu, NN; Revcolevschi, A; Tsopa, N; Chebotar', VZ

Published: MAY 1998, INORGANIC MATERIALS, 34, 483, DOI:

5023. Hydrogen storage in icosahedral and related phases of rapidly solidified Ti-Zr-Ni alloys
Authors: Nicula, R; Jianu, A; Biris, AR; Lupu, D; Manaila, R; Devenyi, A; Kumpf, C; Burkel, E

Published: MAY 1998, EUROPEAN PHYSICAL JOURNAL B, 3, 5, DOI: 10.1007/s100510050277

5024. The gallophosphate molecular sieve cloverite as a host for liquid crystals
Authors: Zubowa, HL; Kosslick, H; Carius, HE; Frunza, S; Frunza, L; Landmesser, H; Richter, M; Schreier, E; Steinike, U; Fricke, R

Published: MAY 1998, MICROPOROUS AND MESOPOROUS MATERIALS, 21, 474, DOI: 10.1016/S1387-1811(98)00065-1

5025. The molecular structure of some urea and thiourea derivatives
Authors: Bally, I; Simion, C; Mazus, MD; Deleanu, C; Popa, N; Bally, D

Published: APR 20 1998, JOURNAL OF MOLECULAR STRUCTURE, 446, 68, DOI: 10.1016/S0022-2860(97)00400-6

5026. Mossbauer and magnetic study of substituted magnetites
Authors: Sorescu, M; Mihaila-Tarabasanu, D; Diamandescu, L

Published: APR 20 1998, APPLIED PHYSICS LETTERS, 72, 2049, DOI: 10.1063/1.121260

5027. Mirror electron microscopy investigations of thin polyethylene films subjected to high voltage
Authors: Godehardt, R; Heydenreich, J; Popescu-Pogrion, N; Tirnovan, M

Published: APR 1 1998, THIN SOLID FILMS, 317, 236, DOI: 10.1016/S0040-6090(97)00522-1

5028. Theoretical calculation of diamond damage by pi(+)/pi(-) mesons in the Delta(33) resonance energy range
Authors: Lazanu, I; Lazanu, S; Borchi, E; Bruzzi, M

Published: APR 1 1998, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 406, 266, DOI:

5029. The (hkl) dependence of diffraction-line broadening caused by strain and size for all Laue groups in Rietveld refinement
Authors: Popa, NC

Published: APR 1 1998, JOURNAL OF APPLIED CRYSTALLOGRAPHY, 31, 180, DOI: 10.1107/S0021889897009795

5030. Study by transmission electron microscopy and electron diffraction of thin polyethylene films
Authors: Popescu-Pogrion, N; Tirnovan, M

Published: APR 1 1998, THIN SOLID FILMS, 317, 234, DOI: 10.1016/S0040-6090(97)00521-X



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