National Institute Of Materials Physics - Romania

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articles found
5141. Electrical and structural properties of anodized porous silicon
Authors: Ciurea, ML; Pentia, E; Lazar, M; BeluMarian, A; Zavaliche, F; Manaila, R

Published: 1996, CAS '96 PROCEEDINGS - 1996 INTERNATIONAL SEMICONDUCTOR CONFERENCE, 19TH EDITION, VOLS 1 AND 2, 236, DOI:

5142. The contribution to the non-uniform distribution of motion effects obtained for the SC-cut quartz plates
Authors: Mateescu, I; Zelenka, J; Mateescu, I

Published: 1996, PROCEEDINGS OF THE 1996 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM (50TH ANNIVERSARY), 411, DOI: 10.1109/FREQ.1996.559888

5143. Optical and microstructural properties of TiO2(Ni2+) thin films
Authors: Parlog, C; Gartner, M; Osiceanu, P; Teodorescu, V; Moise, F; Ianculescu, A

Published: 1996, CERAMICS INTERNATIONAL, 22, 99, DOI: 10.1016/0272-8842(95)00062-3

5144. Thermal stability of Se/CdSe multilayers
Authors: Popescu, M; Sava, F; Lorinczi, A; Koch, PJ; Gutberlet, T; Uebach, W; Bradaczek, H; Vateva, E; Nesheva, D

Published: 1996, CAS '96 PROCEEDINGS - 1996 INTERNATIONAL SEMICONDUCTOR CONFERENCE, 19TH EDITION, VOLS 1 AND 2, 304, DOI:

5145. On the determination of birefringence of liquid crystals by the interference method
Authors: Moldovan, R; Tintaru, M; Frunza, S; Beica, T; Polosan, S

Published: 1996, CRYSTAL RESEARCH AND TECHNOLOGY, 31, 955, DOI: 10.1002/crat.2170310724

5146. Polymer degradation within the glass transition range
Authors: Chipara, MI; Chipara, MD; Romero, JR

Published: 1996, IEEE 1996 ANNUAL REPORT - CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, VOLS I & II, 820, DOI:

5147. Coulomb interaction effects on the magnetoconductivity of laterally modulated two-dimensional electron systems
Authors: Manolescu, A; Gerhardts, RR; Tornow, M; Weiss, D; vonKlitzing, K; Weimann, G

Published: 1996, SURFACE SCIENCE, 361, 516, DOI: 10.1016/0039-6028(96)00458-X

5148. Photoelectric properties of PbTiO3/Si heterostructures
Authors: Alexe, M; Pintilie, L; Pintilie, I; Pignolet, A; Senz, S; Hesse, D

Published: 1996, FERROELECTRIC THIN FILMS V, 433, 430, DOI: 10.1557/PROC-433-425

5149. A study of hydrogenated amorphous silicon (a-Si:H)/electrolyte interface by means of impedance spectroscopy
Authors: Dragoe, D; Maracine, L; Popescu, V; Popescu, C

Published: SEP-OCT 1996, REVUE ROUMAINE DE CHIMIE, 41, 748, DOI:

5150. Dielectric and DSC investigations of 4-n-substituted benzoic and cyclohexane carboxylic acids .1. Textural changes in homologous 4-n-alkoxybenzoic acids
Authors: Frunza, L; Frunza, S; Petrov, M; Sparavigna, A; Torgova, SI

Published: 1996, MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION C-MOLECULAR MATERIALS, 6, 223, DOI:



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