4541
Surface layer in composites containing 4-n-octyl-4 '-cyanobiphenyl. FTIR spectroscopic characterization
Frunza, L; Kosslick, H; Bentrup, U; Pitsch, I; Fricke, R; Frunza, S; Schonhals, A
JUN 1 2003, JOURNAL OF MOLECULAR STRUCTURE, 651, 347
DOI: 10.1016/S0022-2860(03)00110-8
Show abstract
Composites containing 4-n-octyl-4'-cyanobiphenyl (8CB) either confined to nanopores of molecular sieves with very large pores or coating silica nanoparticles of aerosil type at high silica-to-8CB ratios are investigated by IR spectroscopy. Band shape analysis was performed in wavenumber regions in which the peaks due to CN stretching, CH stretching and CH out-of-plane vibrations appear. Some of molecules confined to molecular sieves show spectroscopic features characteristic to a bulk-like 8CB matter located in the centre of the pores or in the inter-grain space. Other features of the IR spectra are due to 8CB molecules located in the surface layer, mostly forming hydrogen bonds between their CN groups and surface OH groups. Another part of the 8CB molecules in the surface layer may also interact by pi electrons of the aromatic rings. Hydrogen bonding is less hindered for the molecules of the surface layers onto aerosil particles than inside pores of the molecular sieves. Comparison is also made with the case of composites based on molecular sieves with small pores. (C) 2003 Elsevier Science B.V. All rights reserved.
4542
Combined chemical-physical methods for enhancing IR photoconductive properties of PbS thin films
Pentia, E; Pintilie, L; Matei, I; Botila, T; Pintilie, I
JUN 2003, INFRARED PHYSICS & TECHNOLOGY, 44, 211
DOI: 10.1016/S1350-4495(02)00225-6
Show abstract
IR photoconductive properties of PbS films can be controlled using two different methods: (1) chemical, controlling the film morphology and, thus, the physical film properties by adding small amounts of impurities in the deposition bath, (2) physical, using field effect in complex PbS/SiO2/Si pseudo-MOS structures to control the photoconductivity of PbS film. (C) 2003 Elsevier Science B.V. All rights reserved.
4543
Iterative evaluation of the complex constants of piezoceramic resonators in the thickness mode
Amarande, L; Miclea, C; Tanasoiu, C
JUN 2003, JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 23, 1145
DOI: 10.1016/S0955-2219(02)00277-7
Show abstract
An iterative method is presented for the characterization of lossy piezoelectric materials in the thickness resonant mode, which allows to calculate the frequencies at which the electrical impedance is to be measured. This new method considerably reduces the measurement time by separating the programs for data acquisition and for processing thus simplifying the measurement procedure. The accuracy of the method was tested for several piezoceramic materials, covering a wide range of values of the thickness coupling factor and mechanical quality factor. The new method proved to be as accurate as other iterative methods, but it is easier to apply. (C) 2002 Elsevier Science Ltd. All rights reserved.
4544
Transport and magnetic properties of Bi1.7Pb0.4Sr1.5Ca2.5Cu3.6Ox/(LiCl)(y) superconductors
Mihalache, V; Aldica, G; Popa, S; Miu, D
JUN 2003, JOURNAL OF SUPERCONDUCTIVITY, 16, 580
DOI: 10.1023/A:1023837508196
Show abstract
We investigated the superconducting critical temperature, the intra- and intergranular critical current density, and the thermopower properties of Bi1.7Pb0.4Sr1.5Ca2.5Cu3.6Ox/(LiCl)(y) samples. All these properties have been compared with those of Bi1.7Pb0.4Sr1.5Ca2.5Cu3.6Ox/(LiF)(y) specimens. It was found that the critical temperature determined from resistive and AC complex susceptibility measurements show a maximum and the transition width shows a minimum for the intermediate values of y. Powder X-ray diffraction studies and the AC complex susceptibility measurements reveal that in our samples the amount of Bi2Sr2Ca2Cu3O10+delta high-temperature superconducting phase is maximum for y approximate to 0: 02: The amount of LiCl in Bi1.7Pb0.4Sr1.5Ca2.5Cu3.6Ox/(LiCl)(y) changes the superconducting properties of the grains as well as of the intergrain matrix. The splitting of the peak in the temperature dependence of the imaginary part of the complex susceptibility, corresponding to the dissipation inside the grains, was also observed.
4545
Growth by MOMBE of c-axis superconducting YBCO thin films on different substrates: In situ RHEED monitoring of the growth
Endo, K; Badica, P; Moriyasu, Y; Abe, K
JUN 2003, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 13, 2794
DOI: 10.1109/TASC.2003.812014
Show abstract
Superconducting YBCO c-axis oriented thin films have been grown by MOMBE (metalorganic molecular-beam-epitaxy). Growth of the films on different substrates (100) (Y, Nd)AlO3, (100) SrTiO3 and (100) MgO has been investigated by, in situ monitoring the reflection high energy electron diffraction (RHEED). The paper discusses our results suggesting significant differences in films growth on the three presented substrates. The highest quality (high uniformity, epitaxy and low roughness) has been attained for the films prepared on SrTiO3. All films, regardless substrates, have shown values between 81 and 84 K for zero resistance critical temperature T-c0.
4546
(119) Oriented Bi-2223 thin films grown on (100) NdGaO3 by MOCVD
Endo, K; Badica, P; Abe, K
JUN 2003, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 13, 2712
DOI: 10.1109/TASC.2003.811963
Show abstract
Orientation control of high T-c superconductors is essential for superior device performance, because the coherence length is longer along the non c-axis directions than along c-axis direction. In this study, we report on the first successful preparation of (119) oriented Bi-2223 films by MOCVD using (100) NdGaO3 Substrates. Atomic force microscopy observations of the (119) Bi-2223 films are also reported. Our films have an in-plane aligned mountain-range-shaped surface morphology. This morphology is resulting from the epitaxial relationship between the (119) Bi-2223 film and (100) NdGaO3 substrate. Films exhibited a large in-plane anisotropy as revealed by, resistivity measurements and surface morphology observations.
4547
Nanodots-induced pinning Centers in thin films: Effects on critical current density, activation energy and flux jump rate
Crisan, A; Badica, P; Fujiwara, S; Nie, JC; Sundaresan, A; Iyo, A; Tanaka, Y
JUN 2003, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 13, 3729
DOI: 10.1109/TASC.2003.812527
Show abstract
By very short time rf sputtering in certain deposition conditions we have grown three-dimensional Ag nanodots on the substrate prior to the growth of TI-based superconducting films. These nanodots create pinning centers, leading to an increase in the critical current density about 10 times. From the frequency dependence of the critical current density we estimated also the, actiation energy for the flux jumps, which resulted to. be several times higher. The rate of the thermally-activated flux jumps decreases several orders of magnitude. We suggest that our method can be used for the reduction of thermal noise in high-T-c dc SQUID's.
4548
Hall probe imaging of local hysteresis inversion and negative remanent fields near the edge of a YBCO thin film
Crisan, A; Pross, A; Humphreys, RG; Bending, S
JUN 2003, SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 16, 698
DOI: 10.1088/0953-2048/16/6/307
Show abstract
We report vortex imaging and local magnetometry studies near the edge of a YBCO thin film using scanning Hall probe microscopy (SHPM). Our data show some unusual features, namely local hysteresis inversion and negative remanent fields, which are semi-quantitatively explained in terms of a theoretical model of flux penetration in an infinite-long thin superconducting strip.
4549
Preparation of Tl-2212 and Tl-1223 superconductor thin films and their microwave surface resistance
Sundaresan, A; Asada, H; Crisan, A; Nie, JC; Kito, H; Iyo, A; Tanaka, Y; Kusunoki, M; Ohshima, S
JUN 2003, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 13, 2916
DOI: 10.1109/TASC.2003.812045
Show abstract
Epitaxial Tl2Ba2CaCu2Oy and Tl(Ba,Sr)(2)Ca-2 Cu3Oy thin films have been prepared on CeO2 buffered sapphire substrate by an ex situ process with high reproducibility. Microstructure analysis of the surface of the TI-2212 films showed well connected and smaller sized grains of 1 mum or less. In the case of TI-1223 film, plate-like crystals with pits and pin holes could be observed. The superconducting critical temperatures of both films are around 96 K. Critical current density measured by ac susceptibility technique is as high as 1 MA/cm(2) at 77 K. The microwave surface resistance of these films was measured over a wide range of temperatures by a HTS-sapphire-HTS resonator method at 38 GHz on films with area 10 mm x 10 mm. The temperature dependence of surface resistance of TI-2212 film follows very closely to that of the best YBCO films on MgO substrate, whereas the TI-1223 exhibits slightly higher values resulting from an inferior surface morphology.
4550
Mossbauer acquisition system for Rayleigh scattering experiments
Kluger, A; Enescu, SE; Bibicu, I; Ciortea, C; Enulescu, A
JUN 2003, REVIEW OF SCIENTIFIC INSTRUMENTS, 74, 3038
DOI: 10.1063/1.1575921
Show abstract
A data acquisition system is reported with a number of improvements over similar systems currently used in Rayleigh scattering of Mossbauer radiation (RSMR) experiments. It is based on a data acquisition board including a Mossbauer function generator with adjustable frequency reference signal delivery, an internal single channel analyzer, and an internal 32 kB random access memory for data storage. The system performances were tested in RSMR measurements on pyrolytic graphite C (002) single crystal by using an iron enriched Fe-57 ( 30 at.%) in rhodium matrix absorber. We want to demonstrate that the reported data acquisition system is suitable for the experimental separation of the elastic and inelastic components of the scattered radiation. The system can be used also in the ordinary Mossbauer measurements as a compact and rapid data acquisition system. In this case it presents the advantage of including also the function generator. (C) 2003 American Institute of Physics.