High-Resolution analytical transmission electron microscope with accessories for in-situ experiments and electron tomography

FACILITIES / STRUCTURAL-CHARACTERIZATION

High-Resolution analytical transmission electron microscope with accessories for in-situ experiments and electron tomography

A multifunctional tool designed for the research and characterization of advanced materials, used for the following types of studies: conventional transmission electron microscopy, high-resolution transmission electron microscopy, electron tomography, in-situ electron microscopy at high or low (cryogenic) temperature, energy dispersive X-ray spectroscopy, elemental chemical mapping.

TECHNICAL SPECIFICATIONS
  • Scanning Transmission Electron Microscopy (STEM) unit with Annular Dark Field detector;
  • Energy dispersive X-ray spectrometer (EDS), fully integrated into the microscope;
  • High-resolution CCD camera for image and electron diffraction recording;
  • Holder with one tilting axis (single tilt);
  • Analytical holder with two tilting axis (double tilt);
  • Holder with two tilting axis (double tilt) for in-situ heating of the sample;
  • Holder with two tilting axis (double tilt) for in-situ cooling of the sample;
  • Software platform for TEM/STEM image and EDS spectra acquisition and processing;
  • Tomography kit for TEM/STEM including electron tomography holder and software platform for automated TEM/STEM image acquisition at predefined tilting angles, 3D image reconstruction and visualization;
  • Unit for electron diffraction with the precession of the incident beam;
  • Water cooling system with closed circuit;
  • UPS unit.


Back to top

Copyright © 2019 National Institute of Materials Physics. All Rights Reserved