OLED and thin films characterization lab


OLED and thin films characterization lab


  • Circular Dichroism Spectrometer J-815,  JASCO
  • Spectroradiometer CS 2000, Konica Minolta
  • Surftest SJ-210- Series 178-Portable Surface Roughness Tester, Mitutoyo
  • FR-pOrtable, ThetaMetrisis
  • Slot-Die Coater, Ossila: https://www.ossila.com/products/slot-die-coater
  • Four-Point Probe: https://www.ossila.com/products/four-point-probe-system
  • Contact Angle Goniometer: https://www.ossila.com/products/contact-angle-goniometer
  • Thin film deposition installation
  • UCL2878 Impedance Spectrometer w. PeakTech DC power supply 6075



  • OLED or similar devices characterization

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