OLED and thin films characterization lab

Equipment

• Circular Dichroism Spectrometer J-815,  JASCO
• Spectroradiometer CS 2000, Konica Minolta
• Surftest SJ-210- Series 178-Portable Surface Roughness Tester, Mitutoyo
• FR-pOrtable, ThetaMetrisis
• Slot-Die Coater, Ossila: https://www.ossila.com/products/slot-die-coater
• Four-Point Probe: https://www.ossila.com/products/four-point-probe-system
• Contact Angle Goniometer: https://www.ossila.com/products/contact-angle-goniometer
• Thin film deposition installation
• UCL2878 Impedance Spectrometer w. PeakTech DC power supply 6075

Services

• OLED or similar devices characterization