Scanning Microscopy Station SPM (NT-MDT)

FACILITIES / SURFACE-SCIENCE

Scanning Microscopy Station SPM (NT-MDT)
  • Available techniques: 
    • Atomic Force Microscopy (AFM) with:
    • (Contact mode) Force modulation technique. Topography and local elasticity images.
    • (Contact mode) Contact Capacitance Technique. Topography and local capacitance images.
    • (Contact mode) Lateral force imaging.
    • (Contact mode) Piezo Force Microscopy.
    • (Contact mode) Spreading resistance imaging.
    • (Semicontact mode) Phase contrast imaging.
    • Lithography operations. Two ways for lithography impact (BV/SP). Two ways for lithography execution (Raster/Vector).
    • Heating stage operations.
    • Operations in liquid.
  • Double-pass techniques: 
    • Magnetic Force Microscopy (MFM).
    • Electrostatic Force Microscopy (EFM).
    • Scanning Kelvin Microscopy (SKM).
    • Scanning Capacitance Microscopy (SCM).
  • Scanning Tunneling Microscopy (STM) mode. 
  • Nanoindentation. 


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