X-ray diffraction systems
FACILITIES / STRUCTURAL-CHARACTERIZATION
X-ray diffraction systems (i) for thin films analysis – Rigaku SmartLab 3 kW (2017) and Bruker D8 Advance (2006) from room-temperature to 1100 °C) and (ii) for powders – Anton Paar XRDynamic (2022) and Bruker D8 Advance (2007), from -190 ° to 600 °C. Structural characterization, allowing identification of crystalline phases, crystalline strain, quality of epitaxy, etc., are tackled.
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