National Institute Of Materials Physics - Romania
Publications
2371. Structural, down- and phase selective up-conversion emission properties of mixed valent Pr doped into oxides with tetravalent cations
Published: 2014, PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 16, 5802, DOI: 10.1039/c3cp54899f
2372. Porous Methyltrimethoxysilane Coated Nanoscale-Hydroxyapatite for Removing Lead Ions from Aqueous Solutions
Published: 2014, JOURNAL OF NANOMATERIALS, 2014, DOI: 10.1155/2014/361061
2373. Magnetization Relaxation in Superconducting YBa2Cu3O7 Films with Embedded Nanorods and Nanoparticles
Published: 2014, SIZE EFFECTS IN NANOSTRUCTURES: BASICS AND APPLICATIONS, 205, 317, DOI: 10.1007/978-3-662-44479-5_9
2374. Laser Emission from Diode-Pumped Nd:YAG Cladding Waveguides Obtained by Direct Writing with a Femtosecond-Laser Beam
Published: 2014, LASER SOURCES AND APPLICATIONS II, 9135, DOI: 10.1117/12.2052250
2375. Self-organization and Size Effects in Amorphous Silicon
Published: 2014, SIZE EFFECTS IN NANOSTRUCTURES: BASICS AND APPLICATIONS, 205, 45, DOI: 10.1007/978-3-662-44479-5_2
2376. COVALENT FUNCTIONALIZATION OF SINGLE WALLED CARBON NANOTUBES WITH DOXORUBICIN FOR CONTROLLED DRUG DELIVERY SYSTEMS
Published: JAN-MAR 2014, DIGEST JOURNAL OF NANOMATERIALS AND BIOSTRUCTURES, 9, 422, DOI:
2377. DEPENDENCE ON THE DYE'S TYPE AND CONCENTRATION OF THE EMISSIVE PROPERTIES OF ELECTROSPUN DYE-DOPED BEADED NANOFIBERS
Published: APR-JUN 2014, DIGEST JOURNAL OF NANOMATERIALS AND BIOSTRUCTURES, 9, 816, DOI:
2378. Band Bending at Ferroelectric Surfaces and Interfaces Investigated by X-ray Photoelectron Spectroscopy
Published: 2014, TIM 2013 PHYSICS CONFERENCE, 1634, 88, DOI: 10.1063/1.4903018
2379. Charge storage properties of HfO2/Ge-HfO2/SiO2 trilayer structures
Published: 2014, 2014 INTERNATIONAL SEMICONDUCTOR CONFERENCE (CAS), 62, DOI:
2380. ZnS and ZnO Semiconductor Nanoparticles Doped with Mn2+ Ions. Size Effects Investigated by EPR Spectroscopy
Published: 2014, SIZE EFFECTS IN NANOSTRUCTURES: BASICS AND APPLICATIONS, 205, 27, DOI: 10.1007/978-3-662-44479-5_1
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