National Institute Of Materials Physics - Romania
Publications
3141. Fano effect in a double T-shaped interferometer
Published: JAN 2009, EUROPEAN PHYSICAL JOURNAL B, 67, 238, DOI: 10.1140/epjb/e2009-00012-0
3142. Optical and structural investigations on rare earth-doped thin films of phosphate glasses prepared by pulsed laser deposition
Published: JAN 2009, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 20, 289, DOI: 10.1007/s10854-008-9583-7
3143. (001) Bi2Sr2Ca2Cu3O10 Superconducting Thin Films on Substrates with Large Film-Substrate Lattice Mismatch and Different Film-Substrate Lattice Mismatch Anisotropy
Published: JAN 2009, CRYSTAL GROWTH & DESIGN, 9, 394, DOI: 10.1021/cg800604b
3144. Nanoblast Synthesis and Consolidation of (La0.8Sr0.2) (Ga0.9Mg0.1)O3-delta Under Spark Plasma Sintering Conditions
Published: JAN 2009, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 9, 149, DOI: 10.1166/jnn.2009.J008
3145. Films and crystalline powder of PbI2 intercalated with ammonia and pyridine
Published: JAN 2009, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 20, 470, DOI: 10.1007/s10854-008-9681-6
3146. Synthesis, structural characterization, and photocatalytic properties of iron-doped TiO2 aerogels
Published: JAN 2009, JOURNAL OF MATERIALS SCIENCE, 44, 364, DOI: 10.1007/s10853-008-3147-3
3147. Characterization of Superconducting Wires By Cone-Beam Micro-Tomography
Published: 2009, 2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9, +, DOI:
3148. Study of the Radiation Hardness of Silicon Sensors for the XFEL
Published: 2009, 2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9, +, DOI:
3149. INVESTIGATION OF ELECTRICAL PROPERTIES OF CARBON NANOTUBES
Published: 2009, CAS: 2009 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, +, DOI: 10.1109/SMICND.2009.5336593
3150. Microstrip Bandpass Filters with a Maximum Number of Attenuation Poles
Published: 2009, 2009 32ND INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY, +, DOI:
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