National Institute Of Materials Physics - Romania
Publications
3181. Interface States in 4H-and 6H-SiC MOS Capacitors: a Comparative Study between Conductance Spectroscopy and Thermal Dielectric Relaxation Current Technique
Published: 2009, SILICON CARBIDE AND RELATED MATERIALS 2008, 615-617, 500, DOI: 10.4028/www.scientific.net/MSF.615-617.497
3182. STUDIES ON MULTIFUNCTIONAL TEXTILE MATERIALS. IMAGE BASED ANALYSIS AND CLASSIC SPECTROSCOPY
3183. Characteristics of Vacuum Deposited Sucrose Thin Films
Published: 2009, INTERFACE CONTROLLED ORGANIC THIN FILMS, 129, 71, DOI: 10.1007/978-3-540-95930-4_11
3184. Microwave Investigations on Some Microstrip Left-Handed Structures
3185. The Influence of Growth Conditions on the Annealing of Irradiation Induced EH6,7 Defects in 4H-SiC
Published: 2009, SILICON CARBIDE AND RELATED MATERIALS 2008, 615-617, 372, DOI: 10.4028/www.scientific.net/MSF.615-617.369
3186. Phase diagram of a lattice of pancake vortex molecules
Published: AUG-OCT 2009, PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 469, 1131, DOI: 10.1016/j.physc.2009.05.202
3187. Influence of Ionizing Radiations (Electrons and Gamma) on the Electrical Characteristics of LGS Resonators
Published: 2009, FERROELECTRICS, 389, 31, DOI: 10.1080/00150190902987517
3188. VIBRATIONAL PROPERTIES OF POLYANILINE FUNCTIONALIZED PbI2
3189. Radio proximity Doppler sensor with high K dielectric materials
Published: 2009, 2009 EUROPEAN RADAR CONFERENCE (EURAD 2009), +, DOI:
3190. Raman and FTIR spectroscopy as valuable tools for the characterization of polymer and carbon nanotube based composites
Published: 2009, JOURNAL OF MATERIALS CHEMISTRY, 19, 5704, DOI: 10.1039/b821136a
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