National Institute Of Materials Physics - Romania
Publications
3381. MAPLE prepared polymeric thin films for non-linear optic applications
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5614, DOI: 10.1016/j.apsusc.2008.07.206
3382. Radiofrequency plasma beam deposition of various forms of carbon based thin films and their characterization
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5381, DOI: 10.1016/j.apsusc.2008.08.042
3383. Thin films of Cu(II)-o,o '-dihydroxy azobenzene nanoparticle-embedded polyacrylic acid (PAA) for nonlinear optical applications developed by matrix assisted pulsed laser evaporation (MAPLE)
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5485, DOI: 10.1016/j.apsusc.2008.10.012
3384. Pulsed-laser deposition of smooth thin films of Er, Pr and Nd doped glasses
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5298, DOI: 10.1016/j.apsusc.2008.10.038
3385. Preparation and characterization of nitrogen-doped TiO2 nanoparticles by the laser pyrolysis of N2O-containing gas mixtures
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5377, DOI: 10.1016/j.apsusc.2008.08.046
3386. Structural investigations of ITO-ZnO films grown by the combinatorial pulsed laser deposition technique
Published: MAR 1 2009, APPLIED SURFACE SCIENCE, 255, 5291, DOI: 10.1016/j.apsusc.2008.07.120
3387. Advanced electrical characterization of ferroelectric thin films: facts and artifacts
Published: MAR 2009, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 11, 228, DOI:
3388. Carbon nanotubes from ethanol on Fe-Co/MgO catalysts and related interface phenomena
Published: MAR 2009, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 11, 347, DOI:
3389. Ceramic laser materials and the prospect for high power lasers
Published: MAR 2009, OPTICAL MATERIALS, 31, 706, DOI: 10.1016/j.optmat.2008.04.007
3390. Composites containing confined n-octyl-cyanobiphenyl: Monomer and dimer species in the surface layer by in situ FTIR spectroscopy
Published: MAR 2009, SPECTROCHIMICA ACTA PART A-MOLECULAR AND BIOMOLECULAR SPECTROSCOPY, 72, 253, DOI: 10.1016/j.saa.2008.09.001
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