National Institute Of Materials Physics - Romania
Publications
3452. ARXPS analysis of silicon oxide films
Published: JUN 2008, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 10, 1383, DOI:
3453. Microstructural and magnetic characterization of CuNb/Nb3Sn wires with different architectures
Published: JUN 2008, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 18, 1025, DOI: 10.1109/TASC.2008.920575
3454. Influence of deviatoric strain for superconducting parameters of Nb3Sn wires
Published: JUN 2008, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 18, 1050, DOI: 10.1109/TASC.2008.921907
3455. The characterization of surfaces of electro polished 316L stainless steel for orthopedic implant applications
Published: JUN 2008, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 10, 1436, DOI:
3456. Doped sol-gel TiO2 films for biological applications
Published: MAY 20 2008, BULLETIN OF THE KOREAN CHEMICAL SOCIETY, 29, 1042, DOI:
3457. Characteristics of arc plasma deposited TiAlZrCN coatings
Published: MAY 15 2008, SURFACE & COATINGS TECHNOLOGY, 202, 3987, DOI: 10.1016/j.surfcoat.2008.02.005
3458. On Eisenbud's and Wigner's R-matrix: A general approach
Published: MAY 15 2008, JOURNAL OF DIFFERENTIAL EQUATIONS, 244, 2577, DOI: 10.1016/j.jde.2008.02.004
3459. Transport properties of electrodeposited ZnO nanowires
Published: MAY 2008, PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 40, 2507, DOI: 10.1016/j.physe.2007.07.013
3460. Rapidly solidified ferromagnetic shape memory alloys
Published: MAY 2008, EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS, 158, 165, DOI: 10.1140/epjst/e2008-00670-6
Copyright © 2025 National Institute of Materials Physics. All Rights Reserved