National Institute Of Materials Physics - Romania
Publications
4911. Optical characterization of dielectric borophosphosilicate glass
Published: APR-MAY 2000, MICROELECTRONICS RELIABILITY, 40, 620, DOI: 10.1016/S0026-2714(99)00291-7
4912. Influence of Bi and Y additions on the electromechanical anisotropy of lead titanate ceramics
Published: 2000, PIEZOELECTRIC MATERIALS: ADVANCES IN SCIENCE, TECHNOLOGY AND APPLICATIONS, 76, 66, DOI:
4913. Piezoelectric properties of tungsten doped PZT type materials
Published: 2000, FERROELECTRICS, 241, 213, DOI: 10.1080/00150190008224993
4914. Preparation and properties of Ce-doped BaTiO3 thin films by r. f. sputtering
Published: 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 692, DOI:
4915. Electron microscopy and synchrotron radiation powder diffraction study of icosahedral Ti-Zr-Ni alloys
Published: 2000, METASTABLE, MECHANICALLY ALLOYED AND NANOCRYSTALLINE MATERIALS, PTS 1 AND 2, 343-3, 36, DOI: 10.4028/www.scientific.net/MSF.343-346.33
4916. A device for critical current measurement in high-Tc ceramic superconductors
Published: 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 715, DOI:
4917. Paracrystallinity
Published: 2000, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2, 656, DOI:
4918. Non-isothermal pyrolysation of the spray-frozen freeze dried complex nitrate in Bi(Pb)-Sr(Ba)-Ca-Cu system investigated by X-ray diffraction analysis
Published: 2000, EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 321-3, 839, DOI: 10.4028/www.scientific.net/MSF.321-324.834
4919. The influence of interface on the spontaneous polarisation in PbTiO3 thin films deposited on a silicon substrate
Published: 2000, PIEZOELECTRIC MATERIALS: ADVANCES IN SCIENCE, TECHNOLOGY AND APPLICATIONS, 76, 308, DOI:
4920. Characterisation of anodic oxide for GaAs based laser diodes
Published: 2000, ROMOPTO 2000: SIXTH CONFERENCE ON OPTICS, 4430, 740, DOI:
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