Microwave dielectric materials and devices testing laboratory

Microwave dielectric materials and devices testing laboratory, including:

• PNA E8361A Vector Network Analyzer  (Fig. 1) from Agilent (0.01 – 67 GHz) for two-ports complex S parameters. It uses electronic calibrator Agilent N4694-60001 in the range of 0.01 – 67 GHz. For access, 1.9 mm, 2.9 mm, 2.4mm, 3.5 mm, SMA or N connectors or adaptors are used.

Fig. 1 Agilent E8361A Network Analyzer.

• PNA-X N5245A Vector Network Analyzer  (Fig. 2) from Agilent (0.1 – 50 GHz standalone) with 4 ports and dual sources. It allows measurements of the S and X non-linear parameters. By using the millimeter wave extensions, the system covers a wide frequency band up to 500 GHz. Each extension pair allows the measurement of the two-ports parameter of waveguide devices. The millimeter wave extensions are from Agilent/OML (N5260A V10 VNA2, WR-10, 75-110 GHz; N5260A V06 VNA2, WR-06, 110-170 GHz; N5260A V05 VNA2, WR-05, 140-220 GHz; N5260A V03 VNA2, WR-03, 220-325 GHz; N5260A V02.2 VNA2, WR-02.2, 325-500 GHz).

Fig. 2 Agilent N5245A Network Analyzer.

• Anechoic chamber (Fig. 3) with internal dimensions 3040 mm × 4100 mm × 2800 mm, for antenna characterizations (e.g. efficiency, radiation pattern) in the range of 0.9 – 40 GHz.

Fig. 3 Anechoic chamber.

• Summit 11000 probe station  (Fig. 4) from Cascade Microtech for direct on-wafer measurements of two-ports in the frequency range 0.1 – 67 GHz by using GSG probes with 150 µm and 100 µm pitches.

Fig. 4 Cascade Microtech Probe Station.

• Pulse IRS 2000 Pro terahertz time-domain spectrometer (Fig. 5) from AISPEC , operating in the range of 200 GHz – 5 THz.

Fig. 5 Aispec IRS 2000 Pro Spectrometer.