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The electrical properties measurements station is designated for characterization at varying temperatures and magnetic fields of semiconductor devices and thin layers of functional and multifunctional materials in a clean room regime.
TECHNICAL SPECIFICATIONS
- 4 XYZ manipulator arms with standardized connection point type elastic metal pin for contacting samples with varying sizes in plan, from 3 mm to 10 mm, and a thickness up to 2 mm;
- Temperature range: 80-350 K with reproducible temperature control system;
- Magnetic field range: up to at least 0.2 T (2000 gauss) permanent magnets.
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