Utilization for Photoconduction spectra and I -V characteristics measurement
Applications: caracterization of thin films and structures
Characteristics: System containing
1. Chopper (Stanford Research System, Model SR 540 chopper controller);
2. Monochromator System (Oriel Cornerstone, Model 130 1/8 m) with interfaces and 5 gratings (180-650 nm; 200-1600 nm; 1100-5000 nm; 4.5-20 mm);
3.Lock-in nanovoltmeter 232 B;
4. Picoammeter Keithley 6487 and multimeter Keithley 2000 with IEEE 488 interface;
5. points perpendicular contact geometry measurement head.
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