High-Resolution analytical transmission electron microscope with accessories for in-situ experiments and electron tomography

A multifunctional tool designed for the research and characterization of advanced materials, used for the following types of studies: conventional transmission electron microscopy, high-resolution transmission electron microscopy, electron tomography, in-situ electron microscopy at high or low (cryogenic) temperature, energy dispersive X-ray spectroscopy, elemental chemical mapping.

• Scanning Transmission Electron Microscopy (STEM) unit with Annular Dark Field detector;
• Energy dispersive X-ray spectrometer (EDS), fully integrated into the microscope;
• High-resolution CCD camera for image and electron diffraction recording;
• Holder with one tilting axis (single tilt);
• Analytical holder with two tilting axis (double tilt);
• Holder with two tilting axis (double tilt) for in-situ heating of the sample;
• Holder with two tilting axis (double tilt) for in-situ cooling of the sample;
• Software platform for TEM/STEM image and EDS spectra acquisition and processing;
• Tomography kit for TEM/STEM including electron tomography holder and software platform for automated TEM/STEM image acquisition at predefined tilting angles, 3D image reconstruction and visualization;
• Unit for electron diffraction with the precession of the incident beam;
• Water cooling system with closed circuit;
• UPS unit.