OLED and thin films characterization lab

FACILITIES / MATERIALS-SYNTHESIS-AND-PROCESSING

OLED and thin films characterization lab

Equipment

  • Circular Dichroism Spectrometer J-815,  JASCO
  • Spectroradiometer CS 2000, Konica Minolta
  • Surftest SJ-210- Series 178-Portable Surface Roughness Tester, Mitutoyo
  • FR-pOrtable, ThetaMetrisis
  • Slot-Die Coater, Ossila: https://www.ossila.com/products/slot-die-coater
  • Four-Point Probe: https://www.ossila.com/products/four-point-probe-system
  • Contact Angle Goniometer: https://www.ossila.com/products/contact-angle-goniometer
  • Thin film deposition installation
  • UCL2878 Impedance Spectrometer w. PeakTech DC power supply 6075

 

Services

  • OLED or similar devices characterization


Back to top

Copyright © 2024 National Institute of Materials Physics. All Rights Reserved