Surface investigation by scanning probe microscopy (SPM) in contact or non-contact mode with piezoelectric (PFM), magnetic (MFM) or conductive (C-AFM) response: NT-MDT NTEGRA system (left) and Asylum MFP 3D SA (right).
Surface investigation by scanning probe microscopy (SPM) in contact or non-contact mode with piezoelectric (PFM), magnetic (MFM) or conductive (C-AFM) response: NT-MDT NTEGRA system (left) and Asylum MFP 3D SA (right).