Surface investigation by scanning probe microscopy (SPM)

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Surface investigation by scanning probe microscopy (SPM)

Surface investigation by scanning probe microscopy (SPM) in contact or non-contact mode with piezoelectric (PFM), magnetic (MFM) or conductive (C-AFM) response: NT-MDT NTEGRA system (left) and Asylum MFP 3D SA (right).

Scanning Probe Microscopy Stations  

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