Surface investigation by scanning probe microscopy (SPM)
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![Surface investigation by scanning probe microscopy (SPM) Surface investigation by scanning probe microscopy (SPM)](https://infim.ro/wp-content/uploads/2022/12/image-1-150x150.png)
Surface investigation by scanning probe microscopy (SPM) in contact or non-contact mode with piezoelectric (PFM), magnetic (MFM) or conductive (C-AFM) response: NT-MDT NTEGRA system (left) and Asylum MFP 3D SA (right).
![](https://infim.ro/wp-content/uploads/2022/12/image-1-1024x502.png)
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